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ISSTA 2009: Chicago, IL, USA
- Gregg Rothermel, Laura K. Dillon:
Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, Chicago, IL, USA, July 19-23, 2009. ACM 2009, ISBN 978-1-60558-338-9
Static analysis and verification
- Martin Bravenboer, Yannis Smaragdakis:
Exception analysis and points-to analysis: better together. 1-12 - Zachary Stengel, Tevfik Bultan:
Analyzing singularity channel contracts. 13-24 - Martin Th Görg, Jianjun Zhao:
Identifying semantic differences in AspectJ programs. 25-36
Testing #1
- Yoram Adler, Eitan Farchi, Moshe Klausner, Dan Pelleg, Orna Raz, Moran Shochat, Shmuel Ur, Aviad Zlotnick:
Advanced code coverage analysis using substring holes. 37-46 - Charles Pecheur, Franco Raimondi, Guillaume Brat:
A formal analysis of requirements-based testing. 47-56 - Akbar Siami Namin, James H. Andrews:
The influence of size and coverage on test suite effectiveness. 57-68
Empirical studies
- David Schuler, Valentin Dallmeier, Andreas Zeller:
Efficient mutation testing by checking invariant violations. 69-80 - Lingxiao Jiang, Zhendong Su:
Automatic mining of functionally equivalent code fragments via random testing. 81-92 - Nadia Polikarpova, Ilinca Ciupa, Bertrand Meyer:
A comparative study of programmer-written and automatically inferred contracts. 93-104
Testing and analysis tools #1
- Adam Kiezun, Vijay Ganesh, Philip J. Guo, Pieter Hooimeijer, Michael D. Ernst:
HAMPI: a solver for string constraints. 105-116 - Andreas Sæbjørnsen, Jeremiah Willcock, Thomas Panas, Daniel J. Quinlan, Zhendong Su:
Detecting code clones in binary executables. 117-128 - Bassem Elkarablieh, Patrice Godefroid, Michael Y. Levin:
Precise pointer reasoning for dynamic test generation. 129-140
Fault localization
- Hong Cheng, David Lo, Yang Zhou, Xiaoyin Wang, Xifeng Yan:
Identifying bug signatures using discriminative graph mining. 141-152 - Saurabh Sinha, Hina Shah, Carsten Görg, Shujuan Jiang, Mijung Kim, Mary Jean Harrold:
Fault localization and repair for Java runtime exceptions. 153-164 - Bin Xin, Xiangyu Zhang:
Memory slicing. 165-176
Testing #2
- Sandro Fouché, Myra B. Cohen, Adam A. Porter:
Incremental covering array failure characterization in large configuration spaces. 177-188 - Christian Murphy, Kuang Shen, Gail E. Kaiser:
Automatic system testing of programs without test oracles. 189-200 - Shin Yoo, Mark Harman, Paolo Tonella, Angelo Susi:
Clustering test cases to achieve effective and scalable prioritisation incorporating expert knowledge. 201-212 - Lu Zhang, Shan-Shan Hou, Chao Guo, Tao Xie, Hong Mei:
Time-aware test-case prioritization using integer linear programming. 213-224
Testing and analysis tools #2
- Prateek Saxena, Pongsin Poosankam, Stephen McCamant, Dawn Song:
Loop-extended symbolic execution on binary programs. 225-236 - Anton Babenko, Leonardo Mariani, Fabrizio Pastore:
AVA: automated interpretation of dynamically detected anomalies. 237-248 - James A. Clause, Alessandro Orso:
Penumbra: automatically identifying failure-relevant inputs using dynamic tainting. 249-260
Domain-specific testing techniques
- Lorenzo Martignoni, Roberto Paleari, Giampaolo Fresi Roglia, Danilo Bruschi:
Testing CPU emulators. 261-272 - Jewgenij Botaschanjan, Benjamin Hummel:
Specifying the worst case: orthogonal modeling of hardware errors. 273-284 - William G. J. Halfond, Saswat Anand, Alessandro Orso:
Precise interface identification to improve testing and analysis of web applications. 285-296
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