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ORCIDIEEE Transactions on Reliability, Volume 57
Volume 57, Number 1, March 2008
- Tsan Sheng Ng:
An Application of the EM Algorithm to Degradation Modeling. 2-13 - Omar Hussain Alhazmi
, Yashwant K. Malaiya:
Application of Vulnerability Discovery Models to Major Operating Systems. 14-22 - Sobeeh Almukhaizim, Yiorgos Makris:
Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires. 23-31 - Tal Avinadav, Tzvi Raz:
A New Inverted U-Shape Hazard Function. 32-40 - Dimitrios Bagkavos, Prakash N. Patil:
Local Polynomial Fitting in Failure Rate Estimation. 41-52 - Zhigang Tian, Richard C. M. Yam, Ming Jian Zuo, Hong-Zhong Huang:
Reliability Bounds for Multi-State k-out-of-n Systems. 53-58 - Li Bai, Erik Blasch:
Two-Way Handshaking Circular Sequential k-Out-of-n Congestion System. 59-70 - Gang Xiao, Zhizhong Li:
Estimation of Dependability Measures and Parameter Sensitivities of a Consecutive-k-out-of-n: F Repairable System With (k-1)-Step Markov Dependence by Simulation. 71-83 - Thomas Cluzeau, Jörg Keller, Winfrid G. Schneeweiss:
An Efficient Algorithm for Computing the Reliability of Consecutive-k-Out-Of-n: F Systems. 84-87 - Wei-Chang Yeh:
A Greedy Branch-and-Bound Inclusion-Exclusion Algorithm for Calculating the Exact Multi-State Network Reliability. 88-93 - Wei-Chang Yeh:
The Extension of Universal Generating Function Method to Search for All One-to-Many d -Minimal Paths of Acyclic Multi-State-Arc Flow-Conservation Networks. 94-102 - Faisal I. Khan, Mahmoud Haddara, Loganathan Krishnasamy:
A New Methodology for Risk-Based Availability Analysis. 103-112 - Runqing Huang, Lingling Meng, Lifeng Xi, C. Richard Liu:
Modeling and Analyzing a Joint Optimization Policy of Block-Replacement and Spare Inventory With Random-Leadtime. 113-124 - Yu-Hung Chien:
Optimal Age-Replacement Policy Under an Imperfect Renewing Free-Replacement Warranty. 125-133 - Claver Diallo, Daoud Ait-Kadi, Anis Chelbi:
(s, Q) Spare Parts Provisioning Strategy for Periodically Replaced Systems. 134-139 - Gregory Levitin:
Optimal Structure of Multi-State Systems With Uncovered Failures. 140-148 - Zhen Jiang, Jie Wu, Dajin Wang:
A New Fault-Information Model for Adaptive & Minimal Routing in 3-D Meshes. 149-162 - Josep Freixas, Montserrat Pons:
Identifying Optimal Components in a Reliability System. 163-170 - Lloyd L. Philipson:
The "Bayesian Anomaly" and Its Practical Mitigation. 171-173 - J. Brian Hall, Ali Mosleh:
A Reliability Growth Projection Model for One-Shot Systems. 174-181 - Heidi A. Taboada, Jose F. Espiritu, David W. Coit:
MOMS-GA: A Multi-Objective Multi-State Genetic Algorithm for System Reliability Optimization Design Problems. 182-191 - Chin-Yu Huang, Wei-Chih Huang:
Software Reliability Analysis and Measurement Using Finite and Infinite Server Queueing Models. 192-203 - Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error Rate Based Test Methodology to Support Error-Tolerance. 204-214
Volume 57, Number 2, June 2008
- Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang:
Degradation Analysis of Nano-Contamination in Plasma Display Panels. 222-229 - Zhengguo Xu, Yindong Ji, Donghua Zhou:
Real-time Reliability Prediction for a Dynamic System Based on the Hidden Degradation Process Identification. 230-242 - Bo Guo, Ping Jiang, Yun-Yan Xing:
A Censored Sequential Posterior Odd Test (SPOT) Method for Verification of the Mean Time To Repair. 243-247 - A. Daniel Block, Lawrence Leemis:
Parametric Model Discrimination for Heavily Censored Survival Data. 248-259 - Yili Hong, William Q. Meeker, Luis A. Escobar:
The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles. 260-266 - Mohamed H. Al-Kuwaiti, Nicholas Kyriakopoulos, S. Hussein:
Towards a Standardized Terminology for Network Performance. 267-271 - János Tapolcai, Pin-Han Ho, Dominique Verchère, Tibor Cinkler, Anwar Haque:
A New Shared Segment Protection Method for Survivable Networks with Guaranteed Recovery Time. 272-282 - Masahiro Hayashi, Takeo Abe:
Evaluating Reliability of Telecommunications Networks Using Traffic Path Information. 283-294 - Chin-Chia Jane, Yih-Wenn Laih:
A Practical Algorithm for Computing Multi-State Two-Terminal Reliability. 295-302 - Zhigang Tian, Ming Jian Zuo, Hong-Zhong Huang:
Reliability-Redundancy Allocation for Multi-State Series-Parallel Systems. 303-310 - Tsun-Yu Hsiao, Chan-Nan Lu:
Risk Informed Design Refinement of a Power System Protection Scheme. 311-321 - Young Kap Son, Gordon J. Savage:
A New Sample-Based Approach to Predict System Performance Reliability. 322-330 - S. Erylmaz:
Lifetime of Combined k-out-of-n and Consecutive kc-out-of-n Systems. 331-335 - Albert F. Myers, Antoine Rauzy:
Efficient Reliability Assessment of Redundant Systems Subject to Imperfect Fault Coverage Using Binary Decision Diagrams. 336-348 - Albert F. Myers:
Achievable Limits on the Reliability of k-out-of-n: G Systems Subject to Imperfect Fault Coverage. 349-354 - Attila Csenki:
Flowgraph Models in Reliability and Finite Automata. 355-359 - Wayne B. Nelson:
Residuals and Their Analyses for Accelerated Life Tests With Step and Varying Stress. 360-368 - Aveek Banerjee, Debasis Kundu:
Inference Based on Type-II Hybrid Censored Data From a Weibull Distribution. 369-378 - Yefim Haim Michlin, Lyubov Meshkov, Irit Grunin:
Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124. 379-387 - Jing Lin:
A Two-Stage Failure Model for Bayesian Change Point Analysis. 388-393
Volume 57, Number 3, September 2008
- Wei Huang:
Failure Probability Evaluation Due to Tin Whiskers Caused Leads Bridging on Compressive Contact Connectors. 426-430 - Preeti Wanti Srivastava, Ruchi Shukla:
A Log-Logistic Step-Stress Model. 431-434 - Francis G. Pascual:
Accelerated Life Test Planning With Independent Weibull Competing Risks. 435-444 - Syuan-Rong Huang, Shuo-Jye Wu:
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions. 445-451 - Rosario Toscano, Patrick Lyonnet:
On-Line Reliability Prediction via Dynamic Failure Rate Model. 452-457 - Tongdan Jin, David W. Coit:
Unbiased Variance Estimates for System Reliability Estimate Using Block Decompositions. 458-464 - C. Durot:
Testing Convexity or Concavity of a Cumulated Hazard Rate. 465-473 - Wang Zheng, Xie Liyang:
Dynamic Reliability Model of Components Under Random Load. 474-479 - M. Tariqul Hasan:
Longitudinal Models for Non-Stationary Exponential Data. 480-488 - Satyanshu K. Upadhyay, Bhaswati Mukherjee:
Assessing the Value of the Threshold Parameter in the Weibull Distribution Using Bayes Paradigm. 489-497 - Jau-Chuan Ke, Hsin-I Huang, Chuen-Horng Lin:
Parametric Programming Approach for a Two-Unit Repairable System With Imperfect Coverage, Reboot and Fuzzy Parameters. 498-506 - Alain Billionnet:
Redundancy Allocation for Series-Parallel Systems Using Integer Linear Programming. 507-516 - Zaili Yang, Stephen Bonsall, Jin Wang:
Fuzzy Rule-Based Bayesian Reasoning Approach for Prioritization of Failures in FMEA. 517-528 - Xiaoyan Zhu, Way Kuo:
Comments on "A Hierarchy of Importance Indices". 529-531 - Francis G. Pascual:
Correction to "Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter". 531-532 - Hichem Boudali, Joanne Bechta Dugan:
Corrections on "A Continuous-Time Bayesian Network Reliability Modeling and Analysis Framework". 532-533
Volume 57, Number 4, December 2008
- Nagi Gebraeel, Jing Pan:
Prognostic Degradation Models for Computing and Updating Residual Life Distributions in a Time-Varying Environment. 539-550 - Pin-Han Ho, János Tapolcai, Anwar Haque:
Spare Capacity Reprovisioning for Shared Backup Path Protection in Dynamic Generalized Multi-Protocol Label Switched Networks. 551-563 - Tongdan Jin:
Hierarchical Variance Decomposition of System Reliability Estimates With Duplicated Components. 564-573 - Majid Asadi, S. Goliforushani:
On the Mean Residual Life Function of Coherent Systems. 574-580 - Wei-Chang Yeh:
A Fast Algorithm for Searching All Multi-State Minimal Cuts. 581-588 - Yi Ding, Ming Jian Zuo, Anatoly Lisnianski, Zhigang Tian:
Fuzzy Multi-State Systems: General Definitions, and Performance Assessment. 589-594 - Akhilesh Shrestha, Liudong Xing:
A Logarithmic Binary Decision Diagram-Based Method for Multistate System Analysis. 595-606 - Norman F. Schneidewind:
Comparison of Reliability and Testing Models. 607-615 - Maria Kateri, Narayanaswamy Balakrishnan:
Inference for a Simple Step-Stress Model With Type-II Censoring, and Weibull Distributed Lifetimes. 616-626 - Serkan Eryilmaz, Subha Chakraborti:
On Start-Up Demonstration Tests Under Exchangeability. 627-632 - Chien-Tai Lin, Yen-Lung Huang, N. Balakrishnan:
A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples. 633-642 - Yeu-Shiang Huang, Cheng-Han Hsieh, Jyh-Wen Ho:
Decisions on an Optimal Life Test Sampling Plan With Warranty Considerations. 643-649 - Ranjan Kumar, Kazuhiro Izui, Masataka Masataka, Shinji Nishiwaki:
Multilevel Redundancy Allocation Optimization Using Hierarchical Genetic Algorithm. 650-661 - Itaru Yoshimura, Yoshinobu Sato:
Safety Achieved by the Safe Failure Fraction (SFF) in IEC 61508. 662-669
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