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2020 – today
- 2022
[j152]Noël Hallemans
, Rik Pintelon, Boris Joukovsky, Dries Peumans, John Lataire:
FRF estimation using multiple kernel-based regularisation. Autom. 136: 110056 (2022)- [j151]Sandra Vásquez, Michel Kinnaert, Rik Pintelon:
On the consistency and asymptotic normality of discrete-time LTI models identified from concatenated data sets. Autom. 140: 110209 (2022) - [j150]Gilles Inghelbrecht, Kurt Barbé, Rik Pintelon:
2-cyclic splitting for mixed-valued least squares in engineering. Digit. Signal Process. 128: 103612 (2022) - [j149]Noël Hallemans, Rik Pintelon, Xinhua Zhu, Thomas Collet, Meisam Dabiri Havigh, Benny Wouters, Reynier I. Revilla, Raf Claessens, Kristof Ramharter, Annick Hubin, John Lataire:
Trend Removal in Measurements of Best Linear Time-Varying Approximations - With Application to Operando Electrochemical Impedance Spectroscopy. IEEE Trans. Instrum. Meas. 71: 1-11 (2022) - 2021
- [j148]Erliang Zhang, Rik Pintelon:
Identification of dynamic errors-in-variables systems with quasi-stationary input and colored noise. Autom. 123: 109344 (2021) - [j147]Noël Hallemans, Rik Pintelon, Els Van Gheem, Thomas Collet, Raf Claessens, Benny Wouters, Kristof Ramharter, Annick Hubin, John Lataire:
Best Linear Time-Varying Approximation of a General Class of Nonlinear Time-Varying Systems. IEEE Trans. Instrum. Meas. 70: 1-14 (2021) - [j146]Noël Hallemans, Rik Pintelon, Xinhua Zhu, Thomas Collet, Raf Claessens, Benny Wouters, Annick Hubin, John Lataire:
Detection, Classification, and Quantification of Nonlinear Distortions in Time-Varying Frequency Response Function Measurements. IEEE Trans. Instrum. Meas. 70: 1-14 (2021) - [j145]Dries Peumans, Rik Pintelon, John Lataire, Gerd Vandersteen:
Frequency Response Function Measurements of Multivariable Systems via Local Rational Modeling. IEEE Trans. Instrum. Meas. 70: 1-9 (2021) - [j144]Rik Pintelon, Dries Peumans, Gerd Vandersteen, John Lataire:
Frequency Response Function Measurements via Local Rational Modeling, Revisited. IEEE Trans. Instrum. Meas. 70: 1-16 (2021) - 2020
- [j143]Gustavo Quintana-Carapia, Ivan Markovsky, Rik Pintelon, Péter Zoltán Csurcsia, Dieter Verbeke:
Bias and covariance of the least squares estimate in a structured errors-in-variables problem. Comput. Stat. Data Anal. 144: 106893 (2020) - [j142]Maarten Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Johan Schoukens:
Extending the Best Linear Approximation Framework to the Process Noise Case. IEEE Trans. Autom. Control. 65(4): 1514-1524 (2020) - [j141]Qinghua Zhang, Lennart Ljung, Rik Pintelon:
On Local LTI Model Coherence for LPV Interpolation. IEEE Trans. Autom. Control. 65(8): 3671-3676 (2020) - [j140]Gilles Inghelbrecht, Rik Pintelon, Kurt Barbé:
Large-Scale Regression: A Partition Analysis of the Least Squares Multisplitting. IEEE Trans. Instrum. Meas. 69(6): 2635-2647 (2020) - [j139]Guido De Angelis, Alessio De Angelis, Antonio Moschitta, Paolo Carbone, Rik Pintelon:
Online Identification of the LC Product in Coupled Resonant Circuits. IEEE Trans. Instrum. Meas. 69(7): 4592-4603 (2020) - [j138]Gustavo Quintana-Carapia, Ivan Markovsky, Rik Pintelon, Péter Zoltán Csurcsia, Dieter Verbeke:
Experimental Validation of a Data-Driven Step Input Estimation Method for Dynamic Measurements. IEEE Trans. Instrum. Meas. 69(7): 4843-4851 (2020) - [j137]Rik Pintelon, Maarten Schoukens, John Lataire:
Best Linear Approximation of Nonlinear Continuous-Time Systems Subject to Process Noise and Operating in Feedback. IEEE Trans. Instrum. Meas. 69(10): 8600-8612 (2020) - [i5]Rik Pintelon, Maarten Schoukens, John Lataire:
Best Linear Approximation of Nonlinear Continuous-Time Systems Subject to Process Noise and Operating in Feedback. CoRR abs/2004.02579 (2020)
2010 – 2019
- 2019
- [j136]Sandra Vásquez, Michel Kinnaert, Rik Pintelon:
Active Fault Diagnosis on a Hydraulic Pitch System Based on Frequency-Domain Identification. IEEE Trans. Control. Syst. Technol. 27(2): 663-678 (2019) - [j135]Rik Pintelon, John Lataire, Gerd Vandersteen:
FRF Measurements Subject to Missing Data: Quantification of Noise, Nonlinear Distortion, and Time-Varying Effects. IEEE Trans. Instrum. Meas. 68(10): 4175-4187 (2019) - 2018
- [j134]Erliang Zhang, Rik Pintelon:
Nonparametric identification of linear dynamic errors-in-variables systems. Autom. 94: 416-425 (2018) - [j133]Dries Peumans, Cedric Busschots, Gerd Vandersteen, Rik Pintelon:
Improved FRF Measurements of Lightly Damped Systems Using Local Rational Models. IEEE Trans. Instrum. Meas. 67(7): 1749-1759 (2018) - [i4]Maarten Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Johan Schoukens:
Extending the Best Linear Approximation Framework to the Process Noise Case. CoRR abs/1804.07510 (2018) - [i3]Johan Schoukens, Mark Vaes, Rik Pintelon:
Linear System Identification in a Nonlinear Setting - Nonparametric analysis of the nonlinear distortions and their impact on the best linear approximation. CoRR abs/1804.09587 (2018) - [i2]Johan Schoukens, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Anne Van Mulders, Gerd Vandersteen:
Structure Discrimination in Block-Oriented Models Using Linear Approximations: A Theoretic Framework. CoRR abs/1804.09648 (2018) - 2017
- [j132]Jan Goos, John Lataire, Ebrahim Louarroudi, Rik Pintelon:
Frequency domain weighted nonlinear least squares estimation of parameter-varying differential equations. Autom. 75: 191-199 (2017) - [j131]Erliang Zhang, Rik Pintelon:
Identification of multivariable dynamic errors-in-variables system with arbitrary inputs. Autom. 82: 69-78 (2017) - [j130]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Time-Variant Frequency Response Function Measurement of Multivariate Time-Variant Systems Operating in Feedback. IEEE Trans. Instrum. Meas. 66(1): 177-190 (2017) - [j129]Rik Pintelon, Diana Ugryumova, Gerd Vandersteen, Ebrahim Louarroudi, John Lataire:
Time-Variant Frequency Response Function Measurement in the Presence of Missing Data. IEEE Trans. Instrum. Meas. 66(11): 3091-3099 (2017) - [i1]Maarten Schoukens, Anna Marconato, Rik Pintelon, Gerd Vandersteen, Yves Rolain:
Parametric identification of parallel Wiener-Hammerstein systems. CoRR abs/1708.06543 (2017) - 2016
- [j128]Jan Goos, Rik Pintelon:
Continuous-time identification of periodically parameter-varying state space models. Autom. 71: 254-263 (2016) - [j127]Jan Goos, Rik Pintelon:
Minimal state space realisation of continuous-time linear time-variant input-output models. Int. J. Control 89(4): 722-730 (2016) - 2015
- [j126]Maarten Schoukens, Anna Marconato, Rik Pintelon, Gerd Vandersteen, Yves Rolain:
Parametric identification of parallel Wiener-Hammerstein systems. Autom. 51: 111-122 (2015) - [j125]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Nonparametric time-variant frequency response function estimates using arbitrary excitations. Autom. 51: 308-317 (2015) - [j124]Johan Schoukens, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Anne Van Mulders, Gerd Vandersteen:
Structure discrimination in block-oriented models using linear approximations: A theoretic framework. Autom. 53: 225-234 (2015) - [j123]Diana Ugryumova, Rik Pintelon, Gerd Vandersteen:
Frequency Response Function Estimation in the Presence of Missing Output Data. IEEE Trans. Instrum. Meas. 64(2): 541-553 (2015) - [j122]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Time-Variant Frequency Response Function Measurements on Weakly Nonlinear, Arbitrarily Time-Varying Systems Excited by Periodic Inputs. IEEE Trans. Instrum. Meas. 64(10): 2829-2837 (2015) - [j121]Diana Ugryumova, Rik Pintelon, Gerd Vandersteen:
Frequency Response Matrix Estimation From Missing Input-Output Data. IEEE Trans. Instrum. Meas. 64(11): 3124-3136 (2015) - [j120]Diana Ugryumova, Rik Pintelon, Gerd Vandersteen:
Frequency Response Matrix Estimation From Partially Missing Data - for Periodic Inputs. IEEE Trans. Instrum. Meas. 64(12): 3615-3628 (2015) - [j119]Ivan Markovsky, Rik Pintelon:
Identification of Linear Time-Invariant Systems From Multiple Experiments. IEEE Trans. Signal Process. 63(13): 3549-3554 (2015) - [c24]Jan Goos, John Lataire, Rik Pintelon:
Detection and quantification of dynamic dependence in linear parameter-varying differential equations. CDC 2015: 747-752 - [c23]Jan Goos, John Lataire, Rik Pintelon:
Estimation of affine LPV state space models in the frequency domain: Extension to transient behavior and non-periodic inputs. ECC 2015: 824-829 - [c22]Jan Goos, Ebrahim Louarroudi, Rik Pintelon:
Generalizing periodically time-varying measurements with a parameter-varying input-output model. I2MTC 2015: 618-622 - [r1]Rik Pintelon:
Nonparametric Techniques in System Identification. Encyclopedia of Systems and Control 2015 - 2014
- [j118]Maarten Schoukens, Rik Pintelon, Yves Rolain:
Identification of Wiener-Hammerstein systems by a nonparametric separation of the best linear approximation. Autom. 50(2): 628-634 (2014) - [j117]Ivan Markovsky, Jan Goos, Konstantin Usevich, Rik Pintelon:
Realization and identification of autonomous linear periodically time-varying systems. Autom. 50(6): 1632-1640 (2014) - [j116]Matthijs van Berkel, Gerd Vandersteen, Egon Geerardyn, Rik Pintelon, Hans Zwart, Marco R. de Baar:
Frequency domain sample maximum likelihood estimation for spatially dependent parameter estimation in PDEs. Autom. 50(8): 2113-2119 (2014) - [j115]Jan De Caigny, Rik Pintelon, Juan F. Camino, Jan Swevers:
Interpolated Modeling of LPV Systems. IEEE Trans. Control. Syst. Technol. 22(6): 2232-2246 (2014) - [j114]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Quantifying the Time-Variation in FRF Measurements Using Random Phase Multisines With Nonuniformly Spaced Harmonics. IEEE Trans. Instrum. Meas. 63(5): 1384-1394 (2014) - [c21]Johan Schoukens, Anna Marconato, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Gerd Vandersteen, Anne Van Mulders:
System identification in a real world. AMC 2014: 1-9 - [c20]Jan Goos, John Lataire, Rik Pintelon:
Estimation of Linear Parameter-Varying affine state space models using synchronized periodic input and scheduling signals. ACC 2014: 3754-3759 - [c19]Jan Goos, Rik Pintelon:
Continuous time frequency domain LPV state space identification via periodic time-varying input-output modeling. CDC 2014: 2567-2572 - 2013
- [j113]Torsten Söderström, Liuping Wang, Rik Pintelon, Johan Schoukens:
Can errors-in-variables systems be identified from closed-loop experiments? Autom. 49(2): 681-684 (2013) - [j112]Erliang Zhang, Rik Pintelon, Johan Schoukens:
Errors-in-variables identification of dynamic systems excited by arbitrary non-white input. Autom. 49(10): 3032-3041 (2013) - [j111]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Detection and Quantification of the Influence of Time Variation in Closed-Loop Frequency-Response-Function Measurements. IEEE Trans. Instrum. Meas. 62(4): 853-863 (2013) - [j110]Rik Pintelon, Johan Schoukens:
FRF Measurement of Nonlinear Systems Operating in Closed Loop. IEEE Trans. Instrum. Meas. 62(5): 1334-1345 (2013) - [j109]Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Zlatko Emedi, Yves Rolain:
Bounding the Polynomial Approximation Errors of Frequency Response Functions. IEEE Trans. Instrum. Meas. 62(5): 1346-1353 (2013) - [j108]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Detecting and Quantifying the Nonlinear and Time-Variant Effects in FRF Measurements Using Periodic Excitations. IEEE Trans. Instrum. Meas. 62(12): 3361-3373 (2013) - [c18]Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon:
Study of Small Data Set Efficiency Losses in System Identification: The FIR Case. ALCOSP 2013: 68-73 - [c17]Laurent Vanbeylen, Ebrahim Louarroudi, Rik Pintelon:
How nonlinear system identification can benefit from recent time-varying tools: The time-varying best linear approximation. CDC 2013: 4913-4918 - [c16]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Nonparametric estimation of the best linear time-invariant approximation of a linear time-varying system. CDC 2013: 5846-5851 - [c15]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
FRF measurements on slowly time-varying systems using multisines with non-uniformly spaced harmonics. I2MTC 2013: 1289-1294 - 2012
- [j107]John Lataire, Rik Pintelon, Ebrahim Louarroudi:
Non-parametric estimate of the system function of a time-varying system. Autom. 48(4): 666-672 (2012) - [j106]Ebrahim Louarroudi, Rik Pintelon, John Lataire:
Nonparametric Tracking of the Time-Varying Dynamics of Weakly Nonlinear Periodically Time-Varying Systems Using Periodic Inputs. IEEE Trans. Instrum. Meas. 61(5): 1384-1394 (2012) - [j105]John Lataire, Ebrahim Louarroudi, Rik Pintelon:
Detecting a Time-Varying Behavior in Frequency Response Function Measurements. IEEE Trans. Instrum. Meas. 61(8): 2132-2143 (2012) - [j104]Johan Schoukens, Gerd Vandersteen, Yves Rolain, Rik Pintelon:
Frequency Response Function Measurements Using Concatenated Subrecords With Arbitrary Length. IEEE Trans. Instrum. Meas. 61(10): 2682-2688 (2012) - [j103]Rik Pintelon, Ebrahim Louarroudi, John Lataire:
Detection and Quantification of the Influence of Time Variation in Frequency Response Function Measurements Using Arbitrary Excitations. IEEE Trans. Instrum. Meas. 61(12): 3387-3395 (2012) - 2011
- [j102]Kurt Barbé, Rik Pintelon, Johan Schoukens, Lieve Lauwers:
Improved Variance Estimates of FRF Measurements in the Presence of Nonlinear Distortions Via Overlap. IEEE Trans. Instrum. Meas. 60(1): 300-309 (2011) - [j101]Kurt Barbé, Rik Pintelon, Gerd Vandersteen:
Finite Record Effects of the Errors-in-Variables Estimator for Linear Dynamic Systems. IEEE Trans. Instrum. Meas. 60(2): 642-654 (2011) - [j100]Maarten Schoukens, Rik Pintelon, Yves Rolain:
Parametric Identification of Parallel Hammerstein Systems. IEEE Trans. Instrum. Meas. 60(12): 3931-3938 (2011) - [j99]Kurt Barbé, Johan Schoukens, Rik Pintelon:
The Use of Nonparametric Noise Models Extracted From Overlapping Subrecords for System Identification. IEEE Trans. Signal Process. 59(10): 4635-4647 (2011) - [c14]Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon:
User friendly Box-Jenkins identification using nonparametric noise models. CDC/ECC 2011: 2148-2153 - [c13]Michel Gevers, Rik Pintelon, Johan Schoukens:
The Local Polynomial Method for nonparametric system identification: Improvements and experimentation. CDC/ECC 2011: 4302-4307 - 2010
- [j98]Johan Paduart, Lieve Lauwers, Jan Swevers, Kris Smolders, Johan Schoukens, Rik Pintelon:
Identification of nonlinear systems using Polynomial Nonlinear State Space models. Autom. 46(4): 647-656 (2010) - [j97]Torsten Söderström, Mei Hong, Johan Schoukens, Rik Pintelon:
Accuracy analysis of time domain maximum likelihood method and sample maximum likelihood method for errors-in-variables and output error identification. Autom. 46(4): 721-727 (2010) - [j96]Gerd Vandersteen, Maulik Jain, Rik Pintelon:
An ARMAX Identification Method for Sigma-Delta Modulators Using Only Input-Output Data. IEEE Trans. Instrum. Meas. 59(5): 1007-1012 (2010) - [j95]Johan Schoukens, Tadeusz P. Dobrowiecki, Yves Rolain, Rik Pintelon:
Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements. IEEE Trans. Instrum. Meas. 59(5): 1141-1148 (2010) - [j94]Johan Schoukens, Kurt Barbé, Laurent Vanbeylen, Rik Pintelon:
Nonlinear Induced Variance of Frequency Response Function Measurements. IEEE Trans. Instrum. Meas. 59(9): 2468-2474 (2010) - [j93]Johan Schoukens, Rik Pintelon:
Study of the Variance of Parametric Estimates of the Best Linear Approximation of Nonlinear Systems. IEEE Trans. Instrum. Meas. 59(12): 3159-3167 (2010) - [j92]Kurt Barbé, Rik Pintelon, Johan Schoukens:
Welch method revisited: nonparametric power spectrum estimation via circular overlap. IEEE Trans. Signal Process. 58(2): 553-565 (2010) - [c12]Johan Schoukens, Yves Rolain, Rik Pintelon:
On the use of parametric and non-parametric noise-models in time- and frequency domain system identification. CDC 2010: 316-321 - [c11]John Lataire, Rik Pintelon:
Parametric frequency domain identification of a time-varying system as a time-dependent weighted sum of time-invariant systems. CDC 2010: 2029-2034
2000 – 2009
- 2009
- [j91]Johan Schoukens, Gerd Vandersteen, Kurt Barbé, Rik Pintelon:
Nonparametric Preprocessing in System Identification: a Powerful Tool. Eur. J. Control 15(3-4): 260-274 (2009) - [j90]Anouk de Brauwere, Fjo De Ridder, Olivier Gourgue, Jonathan Lambrechts, Richard Comblen, Rik Pintelon, Julien Passerat, Pierre Servais, Marc Elskens, Willy Baeyens, Tuomas Kärnä, Benjamin de Brye, Eric Deleersnijder:
Design of a sampling strategy to optimally calibrate a reactive transport model: Exploring the potential for Escherichia coli in the Scheldt Estuary. Environ. Model. Softw. 24(8): 969-981 (2009) - [j89]Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens, Wendy Van Moer:
Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling. IEEE Trans. Instrum. Meas. 58(2): 475-482 (2009) - [j88]John Lataire, Rik Pintelon:
Estimating a Nonparametric Colored-Noise Model for Linear Slowly Time-Varying Systems. IEEE Trans. Instrum. Meas. 58(5): 1535-1545 (2009) - [j87]Johan Schoukens, John Lataire, Rik Pintelon, Gerd Vandersteen, Tadeusz P. Dobrowiecki:
Robustness Issues of the Best Linear Approximation of a Nonlinear System. IEEE Trans. Instrum. Meas. 58(5): 1737-1745 (2009) - [j86]Johan Schoukens, Rik Pintelon:
Estimation of Nonparametric Noise Models for Linear Dynamic Systems. IEEE Trans. Instrum. Meas. 58(8): 2468-2474 (2009) - [j85]Laurent Vanbeylen, Rik Pintelon, Johan Schoukens:
Blind maximum-likelihood identification of wiener systems. IEEE Trans. Signal Process. 57(8): 3017-3029 (2009) - [c10]Johan Schoukens, Gerd Vandersteen, Kurt Barbé, Rik Pintelon:
Nonparametric preprocessing in system identification: A powerful tool. ECC 2009: 1-14 - 2008
- [j84]Johan Schoukens, Rik Pintelon, Martin Enqvist:
Study of the LTI relations between the outputs of two coupled Wiener systems and its application to the generation of initial estimates for Wiener-Hammerstein systems. Autom. 44(7): 1654-1665 (2008) - [j83]Laurent Vanbeylen, Rik Pintelon, Johan Schoukens:
Blind maximum likelihood identification of Hammerstein systems. Autom. 44(12): 3139-3146 (2008) - [j82]Anouk de Brauwere, Fjo De Ridder, Rik Pintelon, Jeroen Meersmans, Johan Schoukens, Frank Dehairs:
Identification of a periodic time series from an environmental proxy record. Comput. Geosci. 34(12): 1781-1790 (2008) - [j81]Kurt Barbé, Johan Schoukens, Rik Pintelon:
Frequency-Domain, Errors-in-Variables Estimation of Linear Dynamic Systems Using Data From Overlapping Subrecords. IEEE Trans. Instrum. Meas. 57(8): 1529-1536 (2008) - [j80]Laurent Vanbeylen, Rik Pintelon, Johan Schoukens:
Application of Blind Identification to Nonlinear Calibration. IEEE Trans. Instrum. Meas. 57(8): 1771-1778 (2008) - [j79]Tom D'haene, Rik Pintelon:
Passivity Enforcement of Transfer Functions. IEEE Trans. Instrum. Meas. 57(10): 2181-2187 (2008) - [j78]Lieve Lauwers, Johan Schoukens, Rik Pintelon, Martin Enqvist:
A Nonlinear Block Structure Identification Procedure Using Frequency Response Function Measurements. IEEE Trans. Instrum. Meas. 57(10): 2257-2264 (2008) - [j77]László Balogh, Rik Pintelon:
Stable Approximation of Unstable Transfer Function Models. IEEE Trans. Instrum. Meas. 57(12): 2720-2726 (2008) - [j76]Edwin Reynders, Rik Pintelon, Guido De Roeck:
Consistent Impulse-Response Estimation and System Realization From Noisy Data. IEEE Trans. Signal Process. 56(7-1): 2696-2705 (2008) - 2007
- [j75]Rik Pintelon, Johan Schoukens:
Frequency domain maximum likelihood estimation of linear dynamic errors-in-variables models. Autom. 43(4): 621-630 (2007) - [j74]Rik Pintelon, Johan Schoukens, Patrick Guillaume:
Box-Jenkins identification revisited - Part III: Multivariable systems. Autom. 43(5): 868-875 (2007) - [j73]Johan Schoukens, Widanalage Dhammika Widanage, Keith R. Godfrey, Rik Pintelon:
Initial estimates for the dynamics of a Hammerstein system. Autom. 43(7): 1296-1301 (2007) - [j72]Yves Rolain, Wendy Van Moer, Johan Schoukens, Rik Pintelon:
Measuring Nonlinear Differential RF Amplifiers Using One Single-Ended Source. IEEE Trans. Instrum. Meas. 56(3): 1042-1048 (2007) - [j71]Rik Pintelon, Mei Hong:
Asymptotic Uncertainty of Transfer-Function Estimates Using Nonparametric Noise Models. IEEE Trans. Instrum. Meas. 56(6): 2599-2605 (2007) - [c9]John Lataire, Gerd Vandersteen, Rik Pintelon:
Interactive presentation: Optimizing analog filter designs for minimum nonlinear distortions using multisine excitations. DATE 2007: 267-272 - 2006
- [j70]Johan Schoukens, Yves Rolain, Rik Pintelon:
Analysis of windowing/leakage effects in frequency response function measurements. Autom. 42(1): 27-38 (2006) - [j69]Rik Pintelon, Johan Schoukens:
Box-Jenkins identification revisited - Part I: Theory. Autom. 42(1): 63-75 (2006) - [j68]Rik Pintelon, Yves Rolain, Johan Schoukens:
Box-Jenkins identification revisited - Part II: Applications. Autom. 42(1): 77-84 (2006) - [j67]Kaushik Mahata, Rik Pintelon, Johan Schoukens:
On Parameter Estimation Using Nonparametric Noise Models. IEEE Trans. Autom. Control. 51(10): 1602-1612 (2006) - [j66]Ludwig De Locht, Gerd Vandersteen, Yves Rolain, Rik Pintelon:
Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations. IEEE Trans. Instrum. Meas. 55(4): 1186-1191 (2006) - [j65]Tom D'haene, Rik Pintelon, Gerd Vandersteen:
An Iterative Method to Stabilize a Transfer Function in the s - and z -Domains. IEEE Trans. Instrum. Meas. 55(4): 1192-1196 (2006) - [j64]Rik Pintelon, Johan Schoukens, Patrick Guillaume:
Continuous-Time Noise Modeling From Sampled Data. IEEE Trans. Instrum. Meas. 55(6): 2253-2258 (2006) - [j63]Johan Schoukens, Yves Rolain, Rik Pintelon:
Leakage Reduction in Frequency-Response Function Measurements. IEEE Trans. Instrum. Meas. 55(6): 2286-2291 (2006) - 2005
- [j62]Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Yves Rolain:
Identification of linear systems with nonlinear distortions. Autom. 41(3): 491-504 (2005) - [j61]Ivan Markovsky, Sabine Van Huffel, Rik Pintelon:
Block-Toeplitz/Hankel Structured Total Least Squares. SIAM J. Matrix Anal. Appl. 26(4): 1083-1099 (2005) - [j60]Ivan Markovsky, Jan C. Willems, Sabine Van Huffel, Bart De Moor, Rik Pintelon:
Application of structured total least squares for system identification and model reduction. IEEE Trans. Autom. Control. 50(10): 1490-1500 (2005) - [j59]Adhemar Bultheel, Marc Van Barel, Yves Rolain, Rik Pintelon:
Numerically robust transfer function modeling from noisy frequency domain data. IEEE Trans. Autom. Control. 50(11): 1835-1839 (2005) - [j58]Fjo De Ridder, Rik Pintelon, Johan Schoukens, David Paul Gillikin:
Modified AIC and MDL model selection criteria for short data records. IEEE Trans. Instrum. Meas. 54(1): 144-150 (2005) - [j57]Rik Pintelon, István Kollár:
On the frequency scaling in continuous-time modeling. IEEE Trans. Instrum. Meas. 54(1): 318-321 (2005) - [j56]Fjo De Ridder, Rik Pintelon, Johan Schoukens, Anouk Verheyden:
Reduction of the Gibbs phenomenon applied on nonharmonic time base distortions. IEEE Trans. Instrum. Meas. 54(3): 1118-1125 (2005) - [j55]Tom D'haene, Rik Pintelon, Johan Schoukens, Els Van Gheem:
Variance analysis of frequency response function measurements using periodic excitations. IEEE Trans. Instrum. Meas. 54(4): 1452-1456 (2005) - [j54]Rik Pintelon, Johan Schoukens, Laurence Pauwels, Els Van Gheem:
Diffusion systems: stability, modeling, and identification. IEEE Trans. Instrum. Meas. 54(5): 2061-2067 (2005) - [c8]Gerd Vandersteen, Ludwig De Locht, Snezana Jenei, Yves Rolain, Rik Pintelon:
Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework. DATE 2005: 1076-1081 - 2004
- [j53]Philippe Crama, Johan Schoukens, Rik Pintelon:
Generation of enhanced initial estimates for Hammerstein Systems. Autom. 40(7): 1269-1273 (2004) - [j52]Johan Schoukens, Tadeusz P. Dobrowiecki, Rik Pintelon:
Estimation of the risk for an unstable behaviour of feedback systems in the presence of nonlinear distortions. Autom. 40(7): 1275-1279 (2004) - [j51]Johan Schoukens, Rik Pintelon, Yves Rolain:
Box-Jenkins alike identification using nonparametric noise models. Autom. 40(12): 2083-2089 (2004) - [j50]Rik Pintelon, Johan Schoukens:
Discussion on: "Identification of Multivariable Models of Fast Ferries". Eur. J. Control 10(2): 199-202 (2004) - [j49]Rik Pintelon, Gerd Vandersteen, Ludwig De Locht, Yves Rolain, Johan Schoukens:
Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations. IEEE Trans. Instrum. Meas. 53(3): 854-862 (2004) - [j48]Rik Pintelon, Yves Rolain, Gerd Vandersteen, Johan Schoukens:
Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements. IEEE Trans. Instrum. Meas. 53(3): 863-876 (2004) - [j47]Johan Schoukens, József G. Nemeth, Gerd Vandersteen, Rik Pintelon, Philippe Crama:
Linearization of nonlinear dynamic systems. IEEE Trans. Instrum. Meas. 53(4): 1245-1248 (2004) - [c7]Johan Schoukens, Rik Pintelon, Yves Rolain:
Time domain identification, frequency domain identification. Equivalencies! Differences? ACC 2004: 661-666 - [c6]Kaushik Mahata, Rik Pintelon, Johan Schoukens:
Frequency domain identification using non-parametric noise models. CDC 2004: 821-826 - [c5]Ivan Markovsky, Jan C. Willems, Sabine Van Huffel, Bart De Moor, Rik Pintelon:
Application of structured total least squares for system identification. CDC 2004: 3382-3387 - [c4]Gerd Vandersteen, Rik Pintelon, Dimitri Linten, Stéphane Donnay:
Extended Subspace Identification of Improper Linear Systems. DATE 2004: 454-459 - 2003
- [j46]Johan Schoukens, József G. Nemeth, Philippe Crama, Yves Rolain, Rik Pintelon:
Fast approximate identification of nonlinear systems. Autom. 39(7): 1267-1274 (2003) - [j45]Rik Pintelon, Johan Schoukens, Yves Rolain:
Uncertainty of transfer function modelling using prior estimated noise models. Autom. 39(10): 1721-1733 (2003) - [j44]Rik Pintelon, Yves Rolain, Wendy Van Moer:
Probability density function for frequency response function measurements using periodic signals. IEEE Trans. Instrum. Meas. 52(1): 61-68 (2003) - [j43]Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon:
Fully automated spectral analysis of periodic signals. IEEE Trans. Instrum. Meas. 52(4): 1021-1024 (2003) - 2002
- [j42]Johan Schoukens, Yves Rolain, Rik Pintelon:
Modified AIC rule for model selection in combination with prior estimated noise models. Autom. 38(5): 903-906 (2002) - [j41]Rik Pintelon:
Frequency-domain subspace system identification using non-parametric noise models. Autom. 38(8): 1295-1311 (2002) - [j40]Rik Pintelon, Johan Schoukens:
Some peculiarities of identification in the presence of model errors. Autom. 38(10): 1683-1693 (2002) - [j39]Nele Dedene, Rik Pintelon, Philippe Lataire:
Measurement of multivariable frequency response functions in the presence of nonlinear distortions-some practical aspects. IEEE Trans. Instrum. Meas. 51(4): 577-582 (2002) - [j38]Gyula Simon, Rik Pintelon, László Sujbert, Johan Schoukens:
An efficient nonlinear least square multisine fitting algorithm. IEEE Trans. Instrum. Meas. 51(4): 750-755 (2002) - [j37]Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki:
Linear modeling in the presence of nonlinear distortions. IEEE Trans. Instrum. Meas. 51(4): 786-792 (2002) - 2001
- [j36]Johan Schoukens, Rik Pintelon, Yves Rolain, Tadeusz P. Dobrowiecki:
Frequency response function measurements in the presence of nonlinear distortions. Autom. 37(6): 939-946 (2001) - [j35]Rudi Vuerinckx, Rik Pintelon, Johan Schoukens, Yves Rolain:
Obtaining accurate confidence regions for the estimated zeros and poles in system identification problems. IEEE Trans. Autom. Control. 46(4): 656-659 (2001) - [j34]Rik Pintelon, Johan Schoukens, Wendy Van Moer, Yves Rolain:
Identification of linear systems in the presence of nonlinear distortions. IEEE Trans. Instrum. Meas. 50(4): 855-863 (2001) - [j33]Wendy Van Moer, Yves Rolain, Rik Pintelon:
Modeling in the presence of switching uncertainties. IEEE Trans. Instrum. Meas. 50(5): 1103-1108 (2001) - [j32]Rik Pintelon, Johan Schoukens:
Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors. IEEE Trans. Instrum. Meas. 50(6): 1753-1760 (2001) - [c3]Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki:
Nonparametric model error bounds for control design in the presence of nonlinear distortions. CDC 2001: 2998-3003 - [c2]Rik Pintelon:
Frequency domain subspace system identification using non-parametric noise models. CDC 2001: 3916-3921 - 2000
- [j31]Rik Pintelon, Johan Schoukens, Yves Rolain:
Box-Jenkins continuous-time modeling. Autom. 36(7): 983-991 (2000) - [j30]Rik Pintelon, Johan Schoukens:
Frequency domain system identification with missing data. IEEE Trans. Autom. Control. 45(2): 364-369 (2000) - [j29]Johan Schoukens, Rik Pintelon, Yves Rolain:
Broadband versus stepped sine FRF measurements. IEEE Trans. Instrum. Meas. 49(2): 275-278 (2000) - [j28]Gerd Vandersteen, Rik Pintelon:
Maximum likelihood estimator for jitter noise models [HF sampling scopes]. IEEE Trans. Instrum. Meas. 49(6): 1282-1284 (2000) - [j27]Jürgen Van Gorp, Johan Schoukens, Rik Pintelon:
Learning neural networks with noisy inputs using the errors-in-variables approach. IEEE Trans. Neural Networks Learn. Syst. 11(2): 402-414 (2000)
1990 – 1999
- 1999
- [j26]Johan Schoukens, Rik Pintelon, Yves Rolain:
Study of conditional ML estimators in time and frequency-domain system identification. Autom. 35(1): 91-100 (1999) - [j25]Yves Rolain, Rik Pintelon:
Generating robust starting values for frequency-domain transfer function estimation. Autom. 35(5): 965-972 (1999) - [j24]Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Patrick Guillaume:
Frequency-domain identification of linear systems using arbitrary excitations and a nonparametric noise model. IEEE Trans. Autom. Control. 44(2): 343-347 (1999) - [j23]Rik Pintelon, Johan Schoukens, Gerd Vandersteen, Yves Rolain:
Identification of invariants of (over)parameterized models: finite sample results. IEEE Trans. Autom. Control. 44(5): 1073-1077 (1999) - [j22]Rik Pintelon, Johan Schoukens:
Identification of continuous-time systems with missing data. IEEE Trans. Instrum. Meas. 48(3): 736-740 (1999) - [j21]Rik Pintelon, Johan Schoukens:
Time series analysis in the frequency domain. IEEE Trans. Signal Process. 47(1): 206-210 (1999) - 1998
- [j20]Rik Pintelon, Patrick Guillaume, Gerd Vandersteen, Yves Rolain:
Analyses, Development, and Applications of TLS Algorithms in Frequency Domain System Identification. SIAM J. Matrix Anal. Appl. 19(4): 983-1004 (1998) - [j19]Johan Schoukens, Tadeusz P. Dobrowiecki, Rik Pintelon:
Parametric and nonparametric identification of linear systems in the presence of nonlinear distortions-a frequency domain approach. IEEE Trans. Autom. Control. 43(2): 176-190 (1998) - [j18]Johan Schoukens, Yves Rolain, Rik Pintelon:
Improved frequency response function measurements for random noise excitations. IEEE Trans. Instrum. Meas. 47(1): 322-326 (1998) - [j17]Patrick Guillaume, Rik Pintelon, Johan Schoukens:
A weighted total least squares estimator for multivariable systems with nearly maximum likelihood properties. IEEE Trans. Instrum. Meas. 47(4): 818-822 (1998) - [j16]Rik Pintelon:
Identification of linear time invariant diffusion phenomena. IEEE Trans. Instrum. Meas. 47(5): 1053-1055 (1998) - 1997
- [j15]Rik Pintelon, Johan Schoukens:
Identification of continuous-time systems using arbitrary signals. Autom. 33(5): 991-994 (1997) - [j14]Johan Schoukens, Rik Pintelon, Gerd Vandersteen, Patrick Guillaume:
Frequency-domain system identification using non-parametric noise models estimated from a small number of data sets. Autom. 33(6): 1073-1086 (1997) - [j13]Yves Rolain, Johan Schoukens, Rik Pintelon:
Order estimation for linear time-invariant systems using frequency domain identification methods. IEEE Trans. Autom. Control. 42(10): 1408-1417 (1997) - [j12]Rik Pintelon, Johan Schoukens, Gerd Vandersteen:
Frequency domain system identification using arbitrary signals. IEEE Trans. Autom. Control. 42(12): 1717-1720 (1997) - [j11]Rik Pintelon, Johan Schoukens, Gerd Vandersteen:
Model selection through a statistical analysis of the global minimum of a weighted nonlinear least squares cost function. IEEE Trans. Signal Process. 45(3): 686-693 (1997) - 1996
- [j10]Rik Pintelon, Johan Schoukens, Tomas McKelvey, Yves Rolain:
Minimum variance bounds for overparameterized models. IEEE Trans. Autom. Control. 41(5): 719-720 (1996) - [j9]Gerd Vandersteen, Hugo Van hamme, Rik Pintelon:
General framework for asymptotic properties of generalized weighted nonlinear least-squares estimators with deterministic and stochastic weighting. IEEE Trans. Autom. Control. 41(10): 1501-1507 (1996) - [j8]Patrick Guillaume, Rik Pintelon:
A Gauss-Newton-like optimization algorithm for "weighted" nonlinear least-squares problems. IEEE Trans. Signal Process. 44(9): 2222-2228 (1996) - [j7]Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon:
Design of stable IIR filters in the complex domain by automatic delay selection. IEEE Trans. Signal Process. 44(9): 2339-2344 (1996) - [c1]Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon:
Design of stable IIR filters in the complex domain by automatic delay selection. ICASSP 1996: 1379-1382 - 1995
- [j6]Patrick Guillaume, Rik Pintelon, Johan Schoukens:
Robust parametric transfer function estimation using complex logarithmic frequency response data. IEEE Trans. Autom. Control. 40(7): 1180-1190 (1995) - [j5]Yves Rolain, Rik Pintelon, K. Q. Xu, H. Vold:
Best conditioned parametric identification of transfer function models in the frequency domain. IEEE Trans. Autom. Control. 40(11): 1954-1960 (1995) - 1994
- [j4]Johan Schoukens, Rik Pintelon, Hugo Van hamme:
Identification of linear dynamic systems using piecewise constant excitations: Use, misuse and alternatives. Autom. 30(7): 1153-1169 (1994) - [j3]Johan Schoukens, Rik Pintelon:
Quantifying model errors of identified transfer functions. IEEE Trans. Autom. Control. 39(8): 1733-1737 (1994) - [j2]Rik Pintelon, Patrick Guillaume, Yves Rolain, Johan Schoukens, Hugo Van hamme:
Parametric identification of transfer functions in the frequency domain-a survey. IEEE Trans. Autom. Control. 39(11): 2245-2260 (1994) - 1991
- [j1]Rik Pintelon:
Comments on 'Design of IIR filters in the complex domain' [by X. Chen and T.W. Parks]. IEEE Trans. Signal Process. 39(6): 1454-1455 (1991)
Coauthor Index
[j142] [i4] [i3] [i2] [j124] [c21] [j113] [j112] [j110] [j109] [c18] [j104] [j102] [j99] [c14] [c13] [j98] [j97] [j95] [j94] [j93] [j92] [c12] [j91] [j89] [j87] [j86] [j85] [c10] [j84] [j83] [j82] [j81] [j80] [j78] [j75] [j74] [j73] [j72] [j70] [j69] [j68] [j67] [j64] [j63] [j62] [j58] [j56] [j55] [j54] [j53] [j52] [j51] [j50] [j49] [j48] [j47] [c7] [c6] [j46] [j45] [j43] [j42] [j40] [j38] [j37] [j36] [j35] [j34] [j32] [c3] [j31] [j30] [j29] [j27] [j26] [j24] [j23] [j22] [j21] [j19] [j18] [j17] [j15] [j14] [j13] [j12] [j11] [j10] [j7] [c1] [j6] [j4] [j3] [j2]
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