"Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss ..."

Yixin Luo et al. (2018)

> Home

Details and statistics

DOI: 10.1145/3219617.3219659

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-08

- view
  authority control:
- export record
  dblp key:
  - conf/sigmetrics/LuoGCHM18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sigmetrics/LuoGCHM18
Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. SIGMETRICS (Abstracts) 2018: 106

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.