"On the design of at-speed testable VLSI circuits."

Mohamed Soufi, Yvon Savaria, Bozena Kaminska (1995)

> Home

Details and statistics

DOI: 10.1109/VTEST.1995.512651

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vts/SoufiSK95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/SoufiSK95
Mohamed Soufi, Yvon Savaria, Bozena Kaminska:
On the design of at-speed testable VLSI circuits. VTS 1995: 290-295

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.