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2020 – today
- 2024
[j2]Muwei Li
, Kurt G. Schilling, Lyuan Xu, Soyoung Choi, Yurui Gao, Zhongliang Zu, Adam W. Anderson, Zhaohua Ding, John C. Gore:
White matter engagement in brain networks assessed by integration of functional and structural connectivity. NeuroImage 302: 120887 (2024)- 2023
- [j1]Yurui Gao, Yu Zhao, Muwei Li, Richard D. Lawless, Kurt G. Schilling, Lyuan Xu, Andrea T. Shafer, Lori L. Beason-Held, Susan M. Resnick, Baxter P. Rogers, Zhaohua Ding, Adam W. Anderson, Bennett A. Landman, John C. Gore:
Functional alterations in bipartite network of white and grey matters during aging. NeuroImage 278: 120277 (2023) - [c6]Yurui Gao, Dylan R. Lawless, Muwei Li, Yu Zhao, Kurt G. Schilling, Lyuan Xu, Andrea T. Shafer, Lori L. Beason-Held, Susan M. Resnick, Baxter P. Rogers, Zhaohua Ding, Adam W. Anderson, Bennett A. Landman, John C. Gore:
Automatic preprocessing pipeline for white matter functional analyses of large-scale databases. Medical Imaging: Image Processing 2023 - 2020
- [c5]Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva:
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS 2020: 1-5 - [c4]Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5 - [c3]Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva:
High-Current State triggered by Operating-Frequency Change. IRPS 2020: 1-4
2010 – 2019
- 2019
- [c2]Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill:
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. IRPS 2019: 1-5 - [c1]Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill:
Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. IRPS 2019: 1-5
Coauthor Index
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