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2010 – 2019
- 2016
[j4]Ayan Paul
, Sang Phill Park, Dinesh Somasekhar, Young Moon Kim, Nitin Borkar, Ulya R. Karpuzcu, Chris H. Kim:
System-Level Power Analysis of a Multicore Multipower Domain Processor With ON-Chip Voltage Regulators. IEEE Trans. Very Large Scale Integr. Syst. 24(12): 3468-3476 (2016)- 2014
- [c6]Subhasish Mitra, Pradip Bose, Eric Cheng, Chen-Yong Cher, Hyungmin Cho, Rajiv V. Joshi, Young Moon Kim, Charles R. Lefurgy, Yanjing Li, Kenneth P. Rodbell, Kevin Skadron, James H. Stathis, Lukasz G. Szafaryn:
The resilience wall: Cross-layer solution strategies. VLSI-DAT 2014: 1-11 - 2013
- [c5]Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra:
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC 2013: 1-4 - [c4]Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker:
Early-life-failure detection using SAT-based ATPG. ITC 2013: 1-10 - 2011
- [j3]Subhasish Mitra, Kevin Brelsford, Young Moon Kim, Hsiao-Heng Lee, Yanjing Li:
Robust System Design to Overcome CMOS Reliability Challenges. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(1): 30-41 (2011) - [j2]Subhasish Mitra, Hyungmin Cho, Ted Hong, Young Moon Kim, Hsiao-Heng Lee, Larkhoon Leem, Yanjing Li, David Lin, Evelyn Mintarno, Diana Mui, Sung-Boem Park, Nishant Patil, Hai Wei, Jie Zhang:
Robust System Design. IPSJ Trans. Syst. LSI Des. Methodol. 4: 2-30 (2011) - 2010
- [c3]Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra:
Cross-layer error resilience for robust systems. ICCAD 2010: 177-180 - [c2]Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra:
Gate-oxide early-life failure identification using delay shifts. VTS 2010: 69-74
2000 – 2009
- 2009
- [j1]Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, Subhasish Mitra:
Overcoming Early-Life Failure and Aging for Robust Systems. IEEE Des. Test Comput. 26(6): 28-39 (2009) - 2008
- [c1]Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra:
Gate-Oxide Early Life Failure Prediction. VTS 2008: 111-118
Coauthor Index
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