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2020 – today
- 2024
[c6]Dhruv Nandakumar, Devin Quinn, Elijah Soba, Eunyoung Kim, Christopher Redino, Chris Chan, Kevin Choi, Abdul Rahman, Edward Bowen:
Foundational Models for Malware Embeddings Using Spatio-Temporal Parallel Convolutional Networks. ICNC 2024: 168-174- 2023
- [i1]Dhruv Nandakumar, Devin Quinn, Elijah Soba, Eunyoung Kim, Christopher Redino, Chris Chan, Kevin Choi, Abdul Rahman, Edward Bowen:
Foundational Models for Malware Embeddings Using Spatio-Temporal Parallel Convolutional Networks. CoRR abs/2305.15488 (2023)
2010 – 2019
- 2017
- [j4]Steven Edwin Cooper
, Chris Chan:
Subjective perception of wind turbine noise - The stereo approach. Proc. Meet. Acoust. 31(1) (2017) - 2014
- [c5]Mirza Beig, Alex Mayer, Chris Chan, Bill Kapralos, Adam Dubrowski:
A Serious Game for Medical-Based Cultural Competence Education and Training. ICALT 2014: 211-212 - 2013
- [j3]Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan:
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30(5): 44-53 (2013) - [j2]Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Serge N. Demidenko, Chris Chan:
Defect cluster recognition system for fabricated semiconductor wafers. Eng. Appl. Artif. Intell. 26(3): 1029-1043 (2013) - 2011
- [j1]Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan:
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. IEEE Trans. Instrum. Meas. 60(10): 3300-3317 (2011) - [c4]Luke Hebbes, Chris Chan:
2-Factor Authentication with 2D Barcodes. HAISA 2011: 86-96 - 2010
- [c3]Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko:
Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers. DELTA 2010: 276-280 - [c2]Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko:
Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. DELTA 2010: 360-366
2000 – 2009
- 2008
- [c1]Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko:
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221
Coauthor Index
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