"A Test Generation Approach for Systems-on-Chip that Use Intellectual ..."

Zhigang Jiang, Sandeep K. Gupta (2003)

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DOI: 10.1109/ATS.2003.1250823

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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Zhigang Jiang, Sandeep K. Gupta:
A Test Generation Approach for Systems-on-Chip that Use Intellectual Property Cores. Asian Test Symposium 2003: 278-283

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