"Reliability-Conscious MOSFET Compact Modeling with Focus on the ..."

Pratik B. Vyas et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405197

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel:
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. IRPS 2021: 1-4

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