"Progressive random access scan: a simultaneous solution to test power, ..."

Dong Hyun Baik, Kewal K. Saluja (2005)

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DOI: 10.1109/TEST.2005.1583994

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dong Hyun Baik, Kewal K. Saluja:
Progressive random access scan: a simultaneous solution to test power, test data volume and test time. ITC 2005: 10

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