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ORCIDRafic Z. Makki
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2010 – 2019
- 2018
[j10]Rafic Z. Makki, Victor V. Zhirnov, Ralph K. Cavin III
, Sami Issa, Marco Iansiti:
Nurturing the Growth of a National Infrastructure in Emerging Technologies. Proc. IEEE 106(7): 1126-1131 (2018)
2000 – 2009
- 2009
- [c13]Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki:
On Wires Holding a Handful of Electrons. NanoNet 2009: 259-269 - 2006
- [j9]Ali Chehab, Saurabh Patel, Rafic Z. Makki:
Scaling of iDDT Test Methods for Random Logic Circuits. J. Electron. Test. 22(1): 11-22 (2006) - 2004
- [c12]Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala:
Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. DELTA 2004: 195-202 - 2002
- [c11]Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley:
IDDT Testing of Embedded CMOS SRAMs. DATE 2002: 1117 - [c10]Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu:
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. DELTA 2002: 403-407 - 2000
- [j8]Jian Liu, Rafic Z. Makki, Ayman I. Kayssi:
Dynamic Power Supply Current Testing of CMOS SRAMs. J. Electron. Test. 16(5): 499-511 (2000)
1990 – 1999
- 1998
- [c9]Jian Liu, Rafic Z. Makki, Ayman I. Kayssi:
Dynamic Power Supply Current Testing of SRAMs. Asian Test Symposium 1998: 348-353 - [c8]Rafic Z. Makki:
Testing of Embedded Memories - The Aggregate. Asian Test Symposium 1998: 519 - 1997
- [j7]Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole:
IDDQ Testing Experiments for Various CMOS Logic Design Structures. VLSI Design 5(3): 253-271 (1997) - [j6]Rafic Z. Makki:
Advancements in Power Supply Current Testing. VLSI Design 5(3): i-ii (1997) - 1995
- [j5]Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle:
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electron. Test. 6(1): 23-43 (1995) - [c7]Jian Liu, Rafic Z. Makki:
Power supply current detectability of SRAM defects. Asian Test Symposium 1995: 367- - [c6]Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle:
Transient Power Supply Current Testing of Digital CMOS Circuits. ITC 1995: 892-901 - 1994
- [j4]Rafic Z. Makki, Shyang-Tai Su:
Analysis and Characterization of State Assignment Techniques for Sequential Machines. VLSI Design 2(1): 81-88 (1994) - [j3]Subbu Muddappa, Rafic Z. Makki, Zbigniew Michalewicz, Sridhar Isukapalli:
Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution Programming. VLSI Design 2(2): 105-116 (1994) - 1992
- [j2]Shyang-Tai Su, Rafic Z. Makki:
Testing of static random access memories by monitoring dynamic power supply current. J. Electron. Test. 3(3): 265-278 (1992) - [c5]Shyang-Tai Su, Rafic Z. Makki:
A testable static RAM structure for efficient coverage of pattern sensitive faults. VTS 1992: 229-234 - 1991
- [j1]Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang:
Automatic Test Pattern Generation with Branch Testing. IEEE Trans. Computers 40(6): 785-791 (1991) - [c4]Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene:
On the Integration of Design and Manufacturing for Improved Testability. ITC 1991: 248-255 - 1990
- [c3]Rafic Z. Makki, J. Muha, Silvio Bou-Ghazale, T. Kaylani:
SSC-a tool for the synthesis of testable sequential machines. Compcon 1990: 455-461 - [c2]Rafic Z. Makki, Krisbnm Palaniswami:
Practical partitioning for testability with time-shared boundary scan. ITC 1990: 970-977
1980 – 1989
- 1986
- [c1]Rafic Z. Makki, C. Tiansheng:
Designing Testable Control Paths with Multiple and Feedback Scan-Paths. ITC 1986: 484-492
Coauthor Index
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