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2020 – today
- 2022
[c10]Maria Karam, Christie Christelis, Evan Hibbard
, Jenny Leung, Tatyana Kumarasamy, Margot Whitfield, Deborah I. Fels:
Workload Evaluations for Closed Captioners. ICCHP-AAATE (1) 2022: 529-535
2010 – 2019
- 2012
- [c9]Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren:
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2012: 82980E - 2011
- [c8]Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren:
Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT 2011: 408-416 - [c7]Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren:
Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750I - 2010
- [c6]Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren:
Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT 2010: 231-239
2000 – 2009
- 2009
- [c5]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT 2009: 155-163 - [c4]Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Statistical identification and analysis of defect development in digital imagers. Digital Photography 2009: 72500 - 2008
- [c3]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT 2008: 305-313 - 2007
- [c2]Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman:
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects. DFT 2007: 517-525 - [c1]Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren:
Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT 2007: 526-534
Coauthor Index
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