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Edgar Olthof

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2020 – today

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2021
[c1]
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  - conf/irps/DuanSOESB21
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Ning Duan, Vignesh Subramanian, Edgar Olthof, Paul Eggenkamp, Michiel van Soestbergen, Richard Braspenning:
Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability. IRPS 2021: 1-7

2000 – 2009

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2006
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Jingchao Wang, Edgar Olthof, Wim Metselaar:
Hot-carrier degradation analysis based on ring oscillators. Microelectron. Reliab. 46(9-11): 1858-1863 (2006)

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