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ORCIDJun-Geol Baek
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2020 – today
- 2024
[j22]Dae-Jung Ahn
, Changdong Jun, Seunghwan Song, Jun-Geol Baek:
Production System Maturity Model (PSMM) for Assessing Manufacturing Execution System. IEEE Access 12: 123459-123475 (2024)- [j21]Yeong-Min Kim, Seunghwan Song, Byoung-Mo Koo, Jeena Son, Yeseul Lee, Jun-Geol Baek:
Enhancing Long-Term Cloud Workload Forecasting Framework: Anomaly Handling and Ensemble Learning in Multivariate Time Series. IEEE Trans. Cloud Comput. 12(2): 789-799 (2024) - [c24]KwanYong Park, Jun-Geol Baek:
DSP R-CNN: Direct Set Prediction Region with CNN features. ICAIIC 2024: 307-312 - [c23]Kio Yun, Jun-Geol Baek:
Reinforcement Learning for Time Series Data with Partially Labeled Anomalies. ICAIIC 2024: 343-347 - [c22]Jeena Son, Seunghwan Song, Jun-Geol Baek:
Patch-Based Time-Series Anomaly Detection with Cross-Variable Attention. ICAIIC 2024: 638-643 - 2023
- [c21]Yeseul Lee, Yunseon Byun, Jun-Geol Baek:
Time Series Anomaly Detection Using Contrastive Learning based One-Class Classification. ICAIIC 2023: 330-335 - [c20]Seungchan Roh, Yonggon Jung, Jun-Geol Baek:
TFE-NET: Time and Feature focus Embedding Network for Multivariate-to-Multivariate Time Series Forecasting. ICAIIC 2023: 474-478 - [c19]Jueun Kim, Seunghwan Song, Woo Young Hwang, Jun-Geol Baek:
Interaction-based Fault Detection and Classification Using Randomly Masked 1D Convolutional Neural Network. ICAIIC 2023: 479-482 - [c18]Jiwon Moon, Seunghwan Song, Jun-Geol Baek:
Multivariate Time Series Anomaly Detection via Temporal Encoder with Normalizing Flow. ICAIIC 2023: 620-624 - 2022
- [j20]Donghwan Kim, Jun-Geol Baek:
Bagging ensemble-based novel data generation method for univariate time series forecasting. Expert Syst. Appl. 203: 117366 (2022) - [j19]Kyuchang Chang, Seung Hwan Park, Jun-Geol Baek:
AGV dispatching algorithm based on deep Q-network in CNC machines environment. Int. J. Comput. Integr. Manuf. 35(6): 662-677 (2022) - [c17]Seunghwan Song, Jun-Geol Baek:
Defect Information Synthesis via Latent Mapping Adversarial Networks. ICAIIC 2022: 17-22 - [c16]Yunseon Byun, Jun-Geol Baek:
Image Synthesis with Single-type Patterns for Mixed-type Pattern Recognition on Wafer Bin Maps. ICAIIC 2022: 39-43 - [c15]Jieun Kim, Jun-Geol Baek:
Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition. ICAIIC 2022: 56-59 - 2021
- [j18]Subin Lee, Kyuchang Chang, Jun-Geol Baek:
Incremental learning using generative-rehearsal strategy for fault detection and classification. Expert Syst. Appl. 184: 115477 (2021) - [j17]Dong-Wook Seo, Kyuchang Chang, Taesu Cheong, Jun-Geol Baek:
A reinforcement learning approach to distribution-free capacity allocation for sea cargo revenue management. Inf. Sci. 571: 623-648 (2021) - [j16]Kyuchang Chang, Youngji Yoo, Jun-Geol Baek:
Anomaly Detection Using Signal Segmentation and One-Class Classification in Diffusion Process of Semiconductor Manufacturing. Sensors 21(11): 3880 (2021) - 2020
- [j15]Jae Yeol Hong, Seung Hwan Park, Jun-Geol Baek:
SSDTW: Shape segment dynamic time warping. Expert Syst. Appl. 150: 113291 (2020) - [j14]In-Seok Lee, Seung Hwan Park, Jun-Geol Baek:
Random-forest-based real-time contrasts control chart using adaptive breakpoints with symbolic aggregate approximation. Expert Syst. Appl. 158: 113407 (2020) - [c14]Seunghwan Song, Jun-Geol Baek:
New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method. ICAART (2) 2020: 926-932 - [c13]Yunseon Byun, Jun-Geol Baek:
Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained Convolutional Neural Networks. ICAART (2) 2020: 974-979
2010 – 2019
- 2019
- [j13]Joo-Hyuk Oh, Jae Yeol Hong, Jun-Geol Baek:
Oversampling method using outlier detectable generative adversarial network. Expert Syst. Appl. 133: 1-8 (2019) - [c12]In-Seok Lee, Jun-Geol Baek:
SAX Breakpoints for Random Forest Based Real-Time Contrast Control Chart. AAAI 2019: 9959-9960 - [c11]Subin Lee, Jun-Geol Baek:
Generative Pseudorehearsal Strategy for Fault Classification Under an Incremental Learning. CSE/EUC 2019: 138-140 - [c10]Kyuchang Chang, Jun-Geol Baek:
Univiariate Signal Preprocessing Methodology for Fault Detection in Semiconductor Manufacturing Process. CSE/EUC 2019: 230-232 - [c9]Jae Yeol Hong, Seung Hwan Park, Jun-Geol Baek:
Segmented Dynamic Time Warping Based Signal Pattern Classification. CSE/EUC 2019: 263-265 - 2017
- [j12]Seongwon Jang, Seung Hwan Park, Jun-Geol Baek:
Real-time contrasts control chart using random forests with weighted voting. Expert Syst. Appl. 71: 358-369 (2017) - [c8]Keun-Tae Park, Jun-Geol Baek:
Various Type of Wavelet Filters on Time Series Forecasting. ICSC 2017: 258-259 - [c7]Jae Yeol Hong, Seung Hwan Park, Jun-Geol Baek:
Solving the Singularity Problem of Semiconductor Process Signal Using Improved Dynamic Time Warping. ICSC 2017: 266-267 - 2014
- [j11]Myungraee Cha, Jun-Seok Kim, Jun-Geol Baek:
Density weighted support vector data description. Expert Syst. Appl. 41(7): 3343-3350 (2014) - 2013
- [j10]Hyunsoo Yoon, Cheong-Sool Park, Jun-Seok Kim, Jun-Geol Baek:
Algorithm learning based neural network integrating feature selection and classification. Expert Syst. Appl. 40(1): 231-241 (2013) - [c6]Seung Hwan Park, Cheong-Sool Park, Jun-Seok Kim, Sung-Shick Kim, Jun-Geol Baek, Daewoong An:
Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process. BigData Congress 2013: 363-368 - [c5]Bo Mi Lim, Jongwoo Kim, Sung-Shick Kim, Jun-Geol Baek:
Point and Interval Estimation Method for Auto-regressive Model with Nonnormal Error. BigData Congress 2013: 379-386 - 2012
- [j9]Hyo-Heon Ko, Jihyun Kim, Sang-Hoon Park, Jun-Geol Baek, Sung-Shick Kim:
Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average. J. Intell. Manuf. 23(3): 443-455 (2012) - 2011
- [j8]Poovich Phaladiganon, Seoung Bum Kim, Victoria C. P. Chen, Jun-Geol Baek, Sun-Kyoung Park:
Bootstrap-Based T2 Multivariate Control Charts. Commun. Stat. Simul. Comput. 40(5): 645-662 (2011) - [j7]Hyoung-Gook Kim, Jin Young Kim, Jun-Geol Baek:
An integrated music video browsing system for personalized television. Expert Syst. Appl. 38(1): 776-784 (2011) - [j6]Jonghyuck Park, Ick-Hyun Kwon, Sung-Shick Kim, Jun-Geol Baek:
Spline regression based feature extraction for semiconductor process fault detection using support vector machine. Expert Syst. Appl. 38(5): 5711-5718 (2011) - [j5]Hyo-Heon Ko, Jun-Seok Kim, Jihyun Kim, Jun-Geol Baek, Sung-Shick Kim:
Intelligent adaptive process control using dynamic deadband for semiconductor manufacturing. Expert Syst. Appl. 38(6): 6759-6767 (2011) - 2010
- [j4]Hyo-Heon Ko, Jihyun Kim, Sung-Shick Kim, Jun-Geol Baek:
Dispatching rule for non-identical parallel machines with sequence-dependent setups and quality restrictions. Comput. Ind. Eng. 59(3): 448-457 (2010)
2000 – 2009
- 2009
- [j3]Chang Ouk Kim, Ick-Hyun Kwon, Jun-Geol Baek:
Asynchronous action-reward learning for nonstationary serial supply chain inventory control. Appl. Intell. 30(2): 187 (2009) - 2008
- [j2]Chang Ouk Kim, Ick-Hyun Kwon, Jun-Geol Baek:
Asynchronous action-reward learning for nonstationary serial supply chain inventory control. Appl. Intell. 28(1): 1-16 (2008) - 2007
- [j1]Jun-Geol Baek, Chang Ouk Kim:
Learning single-issue negotiation strategies using hierarchical clustering method. Expert Syst. Appl. 32(2): 606-615 (2007) - 2006
- [c4]Chang Kim, Jun-Geol Baek, Jin Jun:
Meta-model Driven Collaborative Object Analysis Process for Production Planning and Scheduling Domain. ICCSA (5) 2006: 839-850 - [c3]Joon Hur, Hongchul Lee, Jun-Geol Baek:
An Intelligent Manufacturing Process Diagnosis System Using Hybrid Data Mining. ICDM 2006: 561-575 - [c2]Jun-Geol Baek, Chang Kim, Ick-Hyun Kwon:
An Adaptive Inventory Control Model for a Supply Chain with Nonstationary Customer Demands. PRICAI 2006: 895-900 - 2005
- [c1]Chang Ouk Kim, Yunsun Park, Jun-Geol Baek:
Optimal Signal Control Using Adaptive Dynamic Programming. ICCSA (4) 2005: 148-160
Coauthor Index
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last updated on 2024-09-22 00:33 CEST by the dblp team
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