"Comparison of Open and Resistive-Open Defect Test Conditions in SRAM ..."

Luigi Dilillo et al. (2003)

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DOI: 10.1109/ATS.2003.1250818

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri:
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255

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