"Delay Fault Models and Test Generation for Random Logic Sequential Circuits."

Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell (1992)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2017-03-16

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Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Delay Fault Models and Test Generation for Random Logic Sequential Circuits. DAC 1992: 165-172

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