"Characterization and Modelling of Hot Carrier Degradation in pFETs under ..."

Da Wang et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764561

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang:
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. IRPS 2022: 7

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