"Delay Testing of Digital Circuits by Output Waveform Analysis."

Piero Franco, Edward J. McCluskey (1991)

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DOI: 10.1109/TEST.1991.519745

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Piero Franco, Edward J. McCluskey:
Delay Testing of Digital Circuits by Output Waveform Analysis. ITC 1991: 798-807

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