"Limitations in predicting defect level based on stuck-at fault coverage."

Jaehong Park et al. (1994)

> Home

Details and statistics

DOI: 10.1109/VTEST.1994.292315

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vts/ParkNKMW94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/ParkNKMW94
Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams:
Limitations in predicting defect level based on stuck-at fault coverage. VTS 1994: 186-191

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.