"Alpha-particle-induced upsets in advanced CMOS circuits and technology."

David F. Heidel et al. (2008)

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DOI: 10.1147/RD.523.0225

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/HeidelRCCGOT08
David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang:
Alpha-particle-induced upsets in advanced CMOS circuits and technology. IBM J. Res. Dev. 52(3): 225-232 (2008)

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