"Graph Attention Networks to Identify the Impact of Transistor Degradation ..."

Tarek Mohamed et al. (2024)

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DOI: 10.1109/TCSI.2024.3397460

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type: Journal Article

metadata version: 2024-07-19

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Tarek Mohamed, Victor M. van Santen, Lilas Alrahis, Ozgur Sinanoglu, Hussam Amrouch:
Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Trans. Circuits Syst. I Regul. Pap. 71(7): 3269-3281 (2024)

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