In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of ...

Abstract—In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels.

A method for growing a high purity, low defect layer of semiconductor is described. This method involves depositing a patterned mask of a material ...

It is shown in practical cases of study that it is beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to ...

In this paper, we show on practical cases of study that it is beneficial to complement defect coverage with fault coverage and assess the severity of defect ...

Mar 4, 2020 · This paper presents a statistical adaptive defect simulation based on likelihood-weighted random sampling to evaluate the quality of AMS-RF.

AMS-RF test quality : Assessing defect severity. V Guiterrez, A Gines, G Leger. International Symposium on On-Line Testing and Robust System Design, 2018. 4 ...

AMS-RF test quality : Assessing defect severity. V Guiterrez, A Gines, G Leger. International Symposium on On-Line Testing and Robust System Design, 2018. 4 ...

Valentin Guiterrez, Antonio J. Ginés , Gildas Léger : AMS-RF test quality: Assessing defect severity. IOLTS 2018: 23-28.

AMS-RF test quality: Assessing defect severity. V. Guiterrez, A. Gines and G. Leger Conference · IEEE Int. Symposium on On-Line Testing and Robust ...