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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean ...
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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean ...
Abstract: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on ...
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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean ...
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High Quality Test Pattern Generation and Boolean Satisfiability 1329 ; Approx. $117.88. + $16.53 shipping ; Item description from the seller. ATPG, VLSI Testing, ...
Algorithms for Automatic Test Pattern Generation (ATPG) have to provide a high fault coverage in order to satisfy the quality demands of the chip industry.
ATPG algorithms based on Boolean Satisfiability (SAT) are a promising alternative to structural algorithms being very robust. However,. SAT-based ATPG suffers ...
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Abstract. This article describes the Boolean satis ability method for generating test patterns for single stuck-at faults in combinational circuits.
High Quality Test Pattern Generation Robust Algorithms Using Boolean Satisfiability by Rolf Drechsler, 2012, Springer edition,
Table of Contents · Altmetric Badge. Book Overview · Altmetric Badge. Chapter 1 Introduction · Altmetric Badge. Chapter 2 Circuits and Testing · Altmetric Badge.