Abstract: A new method for high level fault modeling to improve the test generation for the control parts of digital systems was proposed.

Abstract — A new method for high level fault modeling to improve the test generation for the control parts of digital systems was proposed.

Experimental results demonstrated that combining both, high-level control fault reasoning and low- level test generation for data part of a system can help ...

A new method for high level fault modeling to improve the test generation for the control parts of digital systems was proposed.

We developed a new high-level functional fault model based on High-Level Decision Diagrams (HLDD). It allows uniform handling of possible defects in different ...

A new method of high level test generation based on the concept of test groups to prove the correctness of a part of system functionality is proposed. High- ...

Characterization. Test to determine actual values of device AC and DC parameters and the interaction of parameters. Used to set final specifications and to.

A multiple stuck-at fault means that any set of lines is stuck-at some combination of (0,1) values. ▫. The total number of single and multiple stuck-at faults.

4.6 The Multiple Stuck-Fault Model. 4.7 Stuck RTL Variables ... sequential circuits, test generation using high-level models, and test generation systems.

The validation of high-quality tests requires Defect-. Oriented (DO) fault simulation. The purpose of this paper is to propose a methodology for mixed-level ...