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In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based ...
In this paper, we have presented a new linear programming-based test pattern selection methodology. The objective of the methodology is to select an optimal.
In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based ...
Bibliographic details on Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method.
In this paper, we propose a linear programming- based optimal test pattern selection method which aims at reducing the overall defect part level (DPL). Using.
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Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. Conference Paper. Full-text available. Jan 2003.
We present a method for deriving minimal tests to cover multiple fault models. Integer linear program- ming (ILP) is used to select a minimum set of vectors.
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time · 20 Citations · 24 References.
Linear programming (LP) is a tool for solving optimization problems. In 1947, George Dantzig de- veloped an efficient method, the simplex algorithm, ...
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method pp. 354. Lowering Cost of Test: Parallel Test or Low-Cost ATE?