Accounting for the clustering effect is fundamental to increasing the accuracy of defect level (DL) modeling. This result has long been known in yield ...

Accounting for the clustering effect is fundamental to increase the accuracy of Defect Level (DL) model- ing. This result has long been known in yield modeling.

Accounting for the clustering effect is fundamental to increase the accuracy of Defect Level (DL) model- ing. This result has long been known in yield ...

Reducing the complexity of defect level modeling using the clustering effect. Authors: José T. de Sousa. José T. de Sousa. IST/INSEC, Technical University of ...

Accounting for the clustering effect is fundamental to increasing the accuracy of defect level (DL) modeling. This result has long been known in yield ...

This model is improved, reducing its number of parameters from three to two by noticing that multiple faults caused by a single defect can also be modeled ...

Permission to make digital or hard copies of part or all of this work or personal or classroom use is granted without fee provided that copies are not made ...

Accounting for the clustering effect is fundamental to increase the accuracy of Defect Level (DL) modeling. This result has long been known in yield modeling ...

Reducing the complexity of defect level modeling using the clustering effect.

Accounting for the clustering effect is fundamental to increasing the accuracy of defect level (DL) modeling. This result has long been known in yield ...