Abstract: We describe a new reverse simulation approach to analog and mixed-circuit test generation that parallels the digital test generation process.

We describe a new reverse simulation approach to analog and mixed-signal circuit test generation that parallels digital test generation.

We describe a new reverse simulation approach to analog and mixed-signal circuit test generation that parallels digital test generation.

We describe a new reverse simulation approach to analog and mixed-circuit test generation that parallels the digital test generation process.

Test Generation for Mixed-Signal Devices Using Signal Flow Graphs. Ramadoss, Rajesh; Bushnell, Michael L. Journal of Electronic Testing : (JETTA); Boston Vol.

We describe a new reverse simulation approach to analog and mixed-signal circuit test generation that parallels digital test generation.

Mixed circuit testing is known to be a very difficult task. This is due to the difficulty of: testing the analog part of the circuit, controlling the ...

Automatic Test Plan Generation for Analog and Mixed Signal Integrated Circuits using Partial Activation and High Level Simulation.

Editorial · Test Generation for Mixed-Signal Devices Using Signal Flow Graphs · A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault ...

Abstract—The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core.