http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112461876-B
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-303 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate | 2019-09-06^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2022-10-28^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2022-10-28^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-112461876-B |
| titleOfInvention | Detection method and detection system of sample parameters based on energy dispersive fluorescence X-ray spectrometer |
| abstract | The present application relates to a method for detecting parameters of a sample to be measured based on an energy dispersive fluorescence X-ray spectrometer and a detection system thereof. Wherein, in the detection method, the data measured by the energy dispersive fluorescence X-ray spectrometer is processed by a specific algorithm, so as to improve the measurement accuracy of thickness and element content. In particular, the detection method can overcome the problems encountered in the actual measurement process, such as the interference of the same element and the interference of quantum wires, so as to improve the measurement accuracy and at the same time expand the scope of application. |
| priorityDate | 2019-09-06^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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