http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114709171-A

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filingDate 2022-03-31^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e7ef663a86f6ae7eaf54110f875da6c2
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publicationDate 2022-07-05^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114709171-A
titleOfInvention Manufacturing method of semiconductor device, semiconductor device and storage system
abstract The present application provides a method for fabricating a semiconductor device, a semiconductor device, and a storage system. The method includes: providing a substrate, where the substrate includes a substrate, a stack structure, an opening, a first insulating layer, a first filling layer, and a second filling layer, The stacked structure includes a plurality of stacked first steps, the first steps include an insulating dielectric layer and a sacrificial layer arranged in sequence, in the opening, the first sub-opening penetrates the sacrificial layer to the insulating dielectric layer, and the second sub-opening communicates with the first sub-opening and penetrate into the substrate, a first insulating layer and a first filling layer are arranged in the second sub-openings in sequence, and the first sub-opening is filled with a second filling layer; each sacrificial layer and each second filling layer are respectively replaced to include The material of the first metal layer; the substrate and part of the first insulating layer are removed, so that each first filling layer is exposed; and each first filling layer is respectively replaced with a second metal layer. The present application ensures that the overall structure of the semiconductor device has a good supporting effect during the manufacturing process.
priorityDate 2022-03-31^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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