http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102006008858-B4
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8a936f78a4966415722b892cc9194200 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-31735 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q70-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q70-12 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q70-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q70-12 |
| filingDate | 2006-02-25^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2016-10-20^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_872d5d455e6c3d4e9761455f457db422 |
| publicationDate | 2016-10-20^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | DE-102006008858-B4 |
| titleOfInvention | probe means |
| abstract | Probe device for scanning probe microscopy, comprising a cantilever (3) and on the boom (3) formed by an EBD method (electron beam induced deposition) tip (6) produced in the nanometer range, are scanned with the samples to be measured, characterized in that the tip (6) has a cylindrical shape at least at its free end, the tip (6) having a flat end face (7) and the end face (7) of the tip (6) perpendicular to the cylinder axis (ZA), and on at least one layer (8) containing a metal or a metal mixture or an alloy or an electrically conductive plastic is applied to the tip (6) in order to reduce the electrostatic force interactions with the object to be examined so that electrostatic forces (Coulomb forces) do not overlap the mechanical scan through the tip (6). |
| priorityDate | 2006-02-25^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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