http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-3207979-A1

Outgoing Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01C7-041
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filingDate 1982-03-05^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_40e07c30eedbd4f8e4d3753a8d9b4ba7
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publicationDate 1983-09-08^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-3207979-A1
titleOfInvention THICK-LAYER RESISTANCE THERMOMETER
abstract As a base, a thin-film resistance thermometer has a substrate having at least one electrically nonconducting surface on which a thin-film semiconductor resistance element is situated between two metal contacts. The sensitivity of such a resistance thermometer can be appreciably improved by making it of TaOxNy, where x and y fulfil the requirement that x >/= 2-2y and by covering the resistance element with a protective layer.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104025211-B
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2822001-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10942070-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9852829-B2
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9905341-B2
priorityDate 1982-03-05^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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