http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0400396-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e3b0a3dbf8d6c9712d86ea1383fd5327 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate | 1990-05-16^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1994-11-23^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_75b541454685e4ae6702b902d98f3cdb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5d21853f3e988d502f5eb6613947b60 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7768fa34b5ee0d5ed04dc8c68c900dd2 |
| publicationDate | 1994-11-23^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-0400396-B1 |
| titleOfInvention | Metals assay apparatus and method |
| abstract | The present invention discloses an Fluorescence X-ray spectrometry method and device for determining the type and quantity of metals elements in metal and metal alloy samples, particularly precious metal and precious metal alloy samples. The invention provides a method and an apparatus in which an object to be analyzed is positioned so that an X-ray beam that will be generated will coincide with a measurement point on the surface of the object where it is desired that the analysis be carried out. The measurement point is exposed to an X-ray beam having a diameter of 0.1 to 5 mm, causing fluorescence X-ray radiation to be generated which is sampled. Spectral analysis of the captured fluorescence X-ray radiation is then carried out wherein the intensity of selected peaks corresponding to target elements is determined, whereby the relative composition of selected elements can be calculated, thus providing selective quantitative analysis for target elements at the measurement point. The relative composition can be calculated by performing a computer analysis of the spectrum of the captured fluorescence X-ray radiation in which a fundamental parametric method is applied to the intensity values for peaks corresponding to each target element. |
| priorityDate | 1989-05-16^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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