| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-302 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-302
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 |
| filingDate |
1991-11-06^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1996-03-27^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db0b10b19371cc352fff9e997bd41014
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3fa35177435f6ca88d00704d6b6c2a93
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_793ea4c8bbc799cce9be0e207e814e6a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3cc9ed82ec617ade3ce41171a2ea7454 |
| publicationDate |
1996-03-27^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-0485202-B1 |
| titleOfInvention |
Use of STM-like system to measure node voltage on integrated circuits |
| priorityDate |
1990-11-06^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |