| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a7e7b77c57e3c917f9db819d791f3491 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-864
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S977-852 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q40-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01Q60-40 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-40
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-60
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B7-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R29-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q40-00 |
| filingDate |
1998-10-30^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e438710edb72cbb4b0646b347f73151e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7bf5662567666913487d279577a1ac93
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3887fe9166df85d86e0a1b303d5565c7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_486bc4605998f9ca143a127f964c9b12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_329d5549001ece8711820c6dd55be343 |
| publicationDate |
2001-05-09^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-1032828-A4 |
| titleOfInvention |
ELECTROMAGNETIC FORCE DETECTOR HAVING AN OVERFLOWING PART, FOR ELECTROSTATIC FORCE MICROSCOPE |
| abstract |
An atomic force microscope using a cantilevered sensor (12) which is influenced by an electrostatic force given by the charge in the Unit Under Test (40). The cantilever sensor is preferably made of nickel foil. Both charge distribution and thickness of the sample are plotted in a 3D graph. |
| priorityDate |
1997-10-31^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |