http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1147407-A1
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2af3cf4134fbcc4efeb631878c4450d1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a8a9982b1666c54b5bf02d6c944891e4 |
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-633 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C03B37-018 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
filingDate | 1999-12-06^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f6f08485c317f08e396dbd53e4336c79 |
publicationDate | 2001-10-24^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | EP-1147407-A1 |
titleOfInvention | X-ray fluorescent emission analysis to determine material concentration |
abstract | A method and apparatus is disclosed to determine a concentration of dopant in soot that constitutes at least a portion of a soot preform (12) used to form an optical wave guide. The photon source (30) irradiates the soot preform on a mandrel (14). X-ray fluorescent emissions, from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the preform can be controlled by utilizing the detected X-ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation. |
priorityDate | 1998-12-21^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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