http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1224547-B1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4ddcb273a108a5d8472b335280098e06
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-2215
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-1645
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-267
filingDate 2000-10-24^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2004-02-25^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_839df764e1768d08ad724e0470dac940
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_06c8482d81cfffcc8c24afa323df8a90
publicationDate 2004-02-25^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1224547-B1
titleOfInvention Integrated electronic component with a duplicate core logic and hardware fault injector for test purposes
abstract The invention relates to an integrated component (ICT) with at least two core circuits (KK0, KK1) that are of the same type and that can be operated in synchronicity. Said integrated component comprises a comparator unit (VGL) which provides the signals of corresponding outputs (ou0-1, ou1-1; ...; ou0-n, ou1-n) of the core circuits (KK0, KK1) via test inputs (cpi) for their mutual comparison. A hardware fault injector (XR0, XR1) is disposed upstream of said test inputs (cpi) of the comparator unit (VGL) and is controlled via a fault injection input (cx0, cx1).
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-101305356-B
priorityDate 1999-10-26^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525482
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID4616

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