http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1825479-A2

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filingDate 2005-11-18^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9fcc973233a7b4870327e1dc67a9d830
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publicationDate 2007-08-29^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber EP-1825479-A2
titleOfInvention Programmable memory built-in-self-test (mbist) method and apparatus
abstract Programmable memory built-in-self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
priorityDate 2004-11-18^^<http://www.w3.org/2001/XMLSchema#date>
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