Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_48f279441984fea1b0d68bb222d677df |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B2203-017 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B2203-013 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-8238 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-143 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-0047 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0016 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-148 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-128 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-8238 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02697 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B3-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-14 |
filingDate |
2015-02-27^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f711c90600337933aff5e2ba822d6c64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7563cd633fc6caec2730980033b062b8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_084478fa6b9e66f60312f3e69fd73b4c |
publicationDate |
2017-01-11^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-3114467-A1 |
titleOfInvention |
Cmos-based semiconductor device on micro-hotplate and method of fabrication |
abstract |
It is disclosed herein a semiconductor device and a method of manufacturing the semiconductor device. The semiconductor device is made using partly CMOS or CMOS based processing steps, and it includes a semiconductor substrate,a dielectric region over the semiconductor substrate, a heater within the dielectric region and a patterned layer of noble metal above the dielectric region. The method includes the deposition of a photoresist material over the dielectric region, and patterning the photo-resist material to form a patterned region over the dielectric region. The steps of depositing the photo-resist material and patterning the photo-resist material may be performed in sequence using similar photolithography and etching steps to those used in a CMOS process. The resulting semiconductor device is then subjected to further processing steps which ensure that a dielectric membrane and a metal structure within the membrane are formed in the patterned region over the dielectric region. |
priorityDate |
2014-03-05^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |