http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3425374-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_430c89d97f6839f5364904e710af9704 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J2003-2866 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-2893 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05H1-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-73 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-69 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-443 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-69 |
| filingDate | 2018-06-29^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9f50760c9b851dae26c47cc454304d9c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab7cc6a154cf99b3afa2fccc1f1717e5 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c9b7b957772ad6d37d7e8ae732d25f0f |
| publicationDate | 2019-01-09^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | EP-3425374-A1 |
| titleOfInvention | Plasma spectroscopy analysis method |
| abstract | A control metal species that is different from an analyte metal species is added to a sample (60) so as to have a known concentration. The resulting mixture is introduced to a measurement container (10), and an electric current is applied across a pair of electrodes (20, 30) in the measurement container (10) such that the analyte metal species and the control metal species in the sample (60) are concentrated in the vicinity of one of the electrodes (20, 30). An electric current is then applied across the pair of electrodes (20, 30) to generate plasma, and emitted light from the analyte metal species and the control metal species is detected. An analysis emission amount that is a net emission amount at an analysis wavelength that is a wavelength corresponding to the analyte metal species is corrected using a control emission amount that is a net emission amount at a control wavelength that is a wavelength corresponding to the control metal species. The corrected value is compared to a calibration curve obtained by advance measurements of known concentrations of the analyte metal species in order to quantify the analyte metal species in the sample (60). |
| priorityDate | 2017-07-05^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
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