| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_43e9bc481473b7735d51aacc3e34fbba |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2831
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J2001-4252 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8806
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-0418
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N17-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-028
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-0955
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-0288
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-311
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N1-02885 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-42 |
| filingDate |
2017-12-07^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32007b8271cdb9be9a853dfbc12da1a2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a477dd1818352097b56bece86d4c01d2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_95641d5bc5a5c741f500905c1fd9bbaa
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8e72547ec15862d2be730831a47d1ea9 |
| publicationDate |
2019-10-16^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
EP-3551986-A1 |
| titleOfInvention |
Led light source probe card technology for testing cmos image scan devices |
| abstract |
Improved wafer-scale testing of optoelectronic devices, such as CMOS image scan devices, is provided. A probe card includes an LED light source corresponding to each device under test in the wafer. The LED light sources provide light from a phosphor illuminated by the LED. A pinhole and lens arrangement is used to collimate the light provided to the devices under test. Uniformity of illumination can be provided by closed loop control of the LED light sources using internal optical signals as feedback signals, in combination with calibration data relating the optical signal values to emitted optical intensity. Uniformity of illumination can be further improved by providing a neutral density filter for each LED light source to improve uniformity from one source to another and/or to improve uniformity of the radiation pattern from each LED light source. |
| priorityDate |
2016-12-09^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |