http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002090893-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4a78c6fce9c5c5feb094ef27c77cfb1e |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B41J2-445 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03B27-54 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03B27-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J1-06 |
filingDate | 2000-09-18^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b3300efc1b1cf457ec8013bc4eea619b |
publicationDate | 2002-03-27^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2002090893-A |
titleOfInvention | Slit member and slit assembly |
abstract | (57) [Problem] To provide a slit member for restricting an optical path entering a light quantity measuring device by having a sufficient high flatness by being disposed between a light emitting point and a light quantity measuring device; In addition, a slit member is provided which can be positioned sufficiently accurately with respect to the light emitting member, but is hardly affected by light emitted from light emitting points other than the light emitting point to be measured, on the measurement result by the light amount measuring device. I do. SOLUTION: A slit member 34 is made of a metal base material, A metal film member 34a formed by electrolytic plating on the surface of the base material was used, and the film member 34a was formed of a metal having a lower reflectance than the metal constituting the base material. |
priorityDate | 2000-09-18^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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