http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006195202-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_424db9d56b06a23aed410fcf5df652f3
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F1-68
filingDate 2005-01-14^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b6f15efa7f293cac37028910748f4eaf
publicationDate 2006-07-27^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006195202-A
titleOfInvention Photomask blank manufacturing method
abstract A method of manufacturing a photomask blank in which a chromium-based material film is provided on a transparent substrate, and the temperature of an object to be sputtered during sputtering is controlled to 100 ° C. or less by sputtering the chromium-based material film. A method of manufacturing a photomask blank for film formation. [Effect] When a chromium-based material film is formed on a substrate, a chromium-based material film having a very low film stress can be formed by sputtering, so that a photomask blank is manufactured by forming the chromium-based material film. Photomask that can prevent exposure from changing greatly due to changes in film stress before and after forming a film pattern by processing the chromium-based material film, and to provide a photomask capable of high-accuracy exposure A blank can be manufactured stably. [Selection figure] None
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