Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7b84a2e2bcc8c875734733c2afe72fe1 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42376 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-2003 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-518 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-517 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02181 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02178 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0217 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7786 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0228 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-513 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28264 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66462 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-778 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-812 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-41 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-338 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-423 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-49 |
filingDate |
2012-12-11^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c844da52633540fbfe9a26ddd1195131 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dc5a52bcead07d589cb7416e329f2a13 |
publicationDate |
2013-07-18^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2013140956-A |
titleOfInvention |
In-situ grown gate dielectric and field plate dielectric |
abstract |
A method and apparatus for providing a heterostructure field effect transistor (HFET) having a high quality gate dielectric and field plate dielectric. A gate dielectric and a field plate dielectric are deposited in-situ on a semiconductor surface. The location of the gate electrode 118 may be defined by etching the first pattern in the field plate dielectric 110 and using the gate dielectric 108 as an etch stop. Alternatively, an additional etch stop layer may be deposited in-situ between the gate dielectric 108 and the field plate dielectric 110. After etching the first pattern, a conductive material may be deposited and patterned to define the gate electrode 118. A source electrode 112 and a drain electrode 114 that are in electrical contact with the semiconductor surface are formed on both sides of the gate electrode 118. [Selection] Figure 1 |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019071497-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019532842-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013247196-A |
priorityDate |
2011-12-12^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |