| abstract |
An x-ray inspection system for scanning items is provided. The system extends from a stationary x-ray source that defines a plurality of source points extending around a rectangular scan volume from which x-rays can be delivered through the scan volume, and source points that have passed through the scan volume. An array of X-ray detectors arranged to detect X-rays, also extending around the rectangular scanning volume described above, a conveyor arranged to convey items through the scanning volume, and processing the detected X-rays. And at least one processor for producing a scanned image of the item. [Selection diagram] Figure 2C |