http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2976943-B2
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-302 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065 |
| filingDate | 1997-09-02^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1999-11-10^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 1999-11-10^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2976943-B2 |
| titleOfInvention | Failure analysis method for semiconductor device |
| priorityDate | 1997-09-02^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 |
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