http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11174101-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d0dc47e3918b6a7f2174ef411af487dc
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R29-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R29-08
filingDate 1997-12-09^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9e5c465c616f0bb58ce918d8a8416800
publicationDate 1999-07-02^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H11174101-A
titleOfInvention Apparatus and method for measuring uniformity of electromagnetic field
abstract [PROBLEMS] To provide an electromagnetic field uniformity measuring device and a measuring method capable of easily and quickly measuring the electromagnetic field uniformity. In uniformity measuring apparatus of an electromagnetic field for measuring the electromagnetic field uniformity A predetermined area, a plurality of alignment means a 0 to d 3 so as to correspond to a plurality of measurement points within a predetermined area A non-conductive positioning board 42 provided, a measuring probe 30 which is positioned at each measuring point by the positioning means a 0 to d 3 and measures the electric and / or magnetic field level at each measuring point; Monitoring means for monitoring the level measured by the measurement probe 30;
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102841263-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007033254-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102590642-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2021039050-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102841263-B
priorityDate 1997-12-09^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419529090
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID4936

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