http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100378869-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-407 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-388 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00 |
| filingDate | 2000-10-05^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2003-04-07^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2003-04-07^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-100378869-B1 |
| titleOfInvention | Automatized High Temperature Electrical Conductivity/Partial Oxygen Pressure Measurement System |
| abstract | The present invention relates to an automated high temperature electrical conductivity / oxygen partial pressure measuring apparatus, the object of which is to measure the electrical conductivity of the ceramics and the oxygen partial pressure around the specimen under variable temperature conditions, temperature control, measurement and recording process through automation To improve the accuracy of the measurement and to provide a device for reducing the labor of the operator.n n n The configuration of the present invention is a CPU (central processing) for performing an automatic control program of a relay card, measurement and measurement value processing in configuring an automated measuring device for electric conductivity and oxygen partial pressure of ceramics at constant interval temperature conditions. The apparatus) is made into the part which comprised the high temperature electrical conductivity / oxygen partial pressure measuring apparatus in general. |
| priorityDate | 2000-10-05^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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