http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100401930-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-1309 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-02 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-13 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00 |
| filingDate | 2003-03-13^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2003-10-17^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2003-10-17^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-100401930-B1 |
| titleOfInvention | Quality test method of TFT cell array for flat board display using a magnetic field measured by non-contact mode |
| abstract | The present invention relates to an a-Si amorphous thin film transistor (A-Si TFT) and a storage capacitor formed on a glass substrate for driving individual pixels, which is a part of the LCD panel, during a process of manufacturing an LCD panel. The unit TFT cell composed of a capacitor and indium tin oxide (ITO), which is a display electrode, is used to check whether the normal operation of each unit TFT cell on the TFT sheet is arranged in an array. It is for discriminating only TFT sheet before injecting liquid crystal, and it is used to separate MR (Magneto-Resistive) and GMR (MMR) from the ITO electrode connected to each TFT cell on the TFT sheet, which is a component part of the LCD panel. With magnetic field sensors such as Great Maneto-Resistive (IMH) and Induction type Magnetic Head (IMH), the data test pattern (Pattern) electrical signal suitable for the data bus and gate bus connected to all TFT cells on the TFT sheet A first step of operating the TFT, a second step of scanning a magnetic field signal measured through a non-contact magnetic sensor separated from the ITO electrode and the ITO electrode of the specific TFT cell by a predetermined distance, and measuring from the magnetic sensor Analyzed the magnetic field signals to determine the normal operation of each TFT cell of the TFT sheet, which is a component part of the LCD panel, and a high-resolution, high-reliability magnetic field and electric field state (characteristic) distribution chart for each TFT cell constituting the TFT sheet. Characterized in that the third step of writing.n n n Therefore, according to the present invention, the apparatus for determining the quality of each TFT cell of a TFT sheet, which is a component part of the LCD panel, and the measurement mechanism associated therewith, while improving the measurement speed and precision, and improving the measurement speed and precision from the magnetic field sensor for each TFT cell, Direct measurement of the converted electrical signal values such as resistance and current not only enables the acquisition of relevant data with precise electrical characteristics for each TFT cell, but also precise magnetic field measurements for each TFT cell on the TFT sheet constituting the TFT sheet. And a state (characteristic) distribution diagram of high resolution and high reliability using electric signal values such as resistance and current converted therefrom. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101316538-B1 |
| priorityDate | 2003-03-13^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID447604988 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID57350325 |
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