http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101569545-B1

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filingDate 2009-06-04^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2015-11-16^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2015-11-16^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101569545-B1
titleOfInvention Solid-state imaging device, imaging device, electronic apparatus, ad converting device, and ad converting method
abstract In the A / D conversion method of the reference signal comparison type, the P-phase and D-phase of the reference signal SLP_ADC and the pixel signal voltage Vx are compared with each other, and the count clock CKcnt1 is counted based on the result of the comparison. The data of the count result becomes the signal data Dsig of the P-phase and D-phase difference, and CDS processing is also performed. At this time, n-bit A / D conversion processing is repeated W times for each of the P-phase and D-phase of the pixel signal voltage Vx, and they are added to perform digital integration processing. The adverse effect due to the addition in the analog domain does not occur. It is assumed that the signal data is multiplied by W but the noise is multiplied by W. The problem of random noise such as quantization noise and circuit noise accompanying AD conversion which can not exist in the processing in the analog domain is alleviated and noise is reduced.
priorityDate 2008-06-06^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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